Although the electrical properties of carbon fibers and carbon fiber composites are critical to the design of composite materials, a direct measurement of the transverse electrical resistivity of a single carbon fiber has not yet been reported. Significant challenges arise in fabricating specimens and making electrical resistance measurements due to the geometry and small diameter of a single carbon fiber (about 4–7 μm). In this study, we report a specimen design and fabrication technique for measuring the transverse electrical resistance of an individual carbon fiber by the van der Pauw method. IM7 carbon fiber specimens are fabricated by a combination of photolithography and the focused ion beam. Specimen thickness, which is required for resistivity calculations, is measured by atomic force microscopy. We measure mean transverse electrical resistivity of (9.3 ± 0.3) × 10−5 Ω m, which is roughly six times greater than the reported longitudinal values. Our measurement technique can be applied to a range of conductive fibers. More accurate measurements of the electrical conduction in carbon fibers are critical for applications such as electromagnetic interference shielding, structural health monitoring, and lightning strike protection.
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21 September 2021
Research Article|
September 21 2021
Single carbon fiber transverse electrical resistivity measurement via the van der Pauw method
Satoshi Matsuo
;
Satoshi Matsuo
a)
1
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
2
Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
3
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
a)Author to whom correspondence should be addressed: [email protected]
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Nancy R. Sottos
Nancy R. Sottos
a)
1
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
2
Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
3
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
a)Author to whom correspondence should be addressed: [email protected]
Search for other works by this author on:
Satoshi Matsuo
1,2,3,a)
Nancy R. Sottos
1,2,3,a)
1
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
2
Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
3
Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign
, Urbana, Illinois 61801, USA
a)Author to whom correspondence should be addressed: [email protected]
J. Appl. Phys. 130, 115105 (2021)
Article history
Received:
June 15 2021
Accepted:
August 22 2021
Citation
Satoshi Matsuo, Nancy R. Sottos; Single carbon fiber transverse electrical resistivity measurement via the van der Pauw method. J. Appl. Phys. 21 September 2021; 130 (11): 115105. https://doi.org/10.1063/5.0060126
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