We report a bulk-sensitive x-ray magnetic microscope that exploits a new magneto-optical effect in x-ray emission, referred to as x-ray magnetic circularly polarized emission (XMCPE). An advantage of XMCPE is a large magnetic dichroic effect for transition-metal elements in the hard x-ray region, which enables the realization of a bulk-sensitive microscope suited to iron- and cobalt-rich ferromagnetic materials. We constructed a scanning microscope with 10 m lateral resolution. A key element is a Montel-type collimating mirror that widely collects the divergent x rays emitted from a sample and converts them into a well-collimated x-ray beam, which is required for circular polarization analysis. Owing to this mirror, the obtained XMCPE spectra of metallic iron exhibited strong intensity and a large magnetic dichroic effect. The performance of the microscope is also demonstrated by the acquisition of magnetization images of an electrical steel sheet with an insulating coating.
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21 September 2021
Research Article|
September 15 2021
Bulk-sensitive magnetic microscope utilizing x-ray magnetic circularly polarized emission
Kento Sugawara
;
Kento Sugawara
1
Synchrotron Radiation Research Center, National Institutes for Quantum and Radiological Science and Technology
, 1-1-1 Koto, Sayo, Hyogo 679-5148, Japan
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Toshiya Inami
;
Toshiya Inami
a)
1
Synchrotron Radiation Research Center, National Institutes for Quantum and Radiological Science and Technology
, 1-1-1 Koto, Sayo, Hyogo 679-5148, Japan
a)Author to whom correspondence should be addressed: inami.toshiya@qst.go.jp
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Takahiro Nakada;
Takahiro Nakada
2
Kurashiki Material Performance Evaluation Center, West Japan Solution Division, JFE Techno-Research Corporation
, Kurashiki, Okayama 712-8074, Japan
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Yui Sakaguchi;
Yui Sakaguchi
3
Nano-scale Characterization Center, Functional Materials Solution Division, JFE Techno-Research Corporation
, Chiba 260-0835, Japan
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Shin Takahashi
Shin Takahashi
3
Nano-scale Characterization Center, Functional Materials Solution Division, JFE Techno-Research Corporation
, Chiba 260-0835, Japan
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a)Author to whom correspondence should be addressed: inami.toshiya@qst.go.jp
J. Appl. Phys. 130, 113901 (2021)
Article history
Received:
May 27 2021
Accepted:
August 09 2021
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Citation
Kento Sugawara, Toshiya Inami, Takahiro Nakada, Yui Sakaguchi, Shin Takahashi; Bulk-sensitive magnetic microscope utilizing x-ray magnetic circularly polarized emission. J. Appl. Phys. 21 September 2021; 130 (11): 113901. https://doi.org/10.1063/5.0058201
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