A complete set of all optical phonon modes predicted by symmetry for bixbyite structure indium oxide is reported here from a combination of far-infrared and infrared spectroscopic ellipsometry, as well as first principles calculations. Dielectric function spectra measured on high quality, marginally electrically conductive melt grown single bulk crystals are obtained on a wavelength-by-wavelength (also known as point-by-point) basis and by numerical reduction of a subtle free charge carrier Drude model contribution. A four-parameter semi-quantum model is applied to determine all 16 pairs of infrared-active transverse and longitudinal optical phonon modes, including the high-frequency dielectric constant, . The Lyddane–Sachs–Teller relation then gives access to the static dielectric constant, . All experimental results are in excellent agreement with our density functional theory calculations and with previously reported values, where existent. We also perform optical Hall effect measurements and determine for the unintentionally doped -type sample a free electron density of , a mobility of /(Vs), and an effective mass parameter of . Density and mobility parameters compare very well with the results of electrical Hall effect measurements. Our effective mass parameter, which is measured independently of any other experimental technique, represents the bottom curvature of the point in in agreement with previous extrapolations. We use terahertz spectroscopic ellipsometry to measure the quasi-static response of , and our model validates the static dielectric constant obtained from the Lyddane–Sachs–Teller relation.
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14 June 2021
Research Article|
June 08 2021
Optical phonon modes, static and high-frequency dielectric constants, and effective electron mass parameter in cubic In2O3 Available to Purchase
Special Collection:
Wide Bandgap Semiconductor Materials and Devices
Megan Stokey
;
Megan Stokey
a)
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
a)Author to whom correspondence should be addressed: [email protected]. URL: http://ellipsometry.unl.edu
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Rafał Korlacki
;
Rafał Korlacki
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
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Sean Knight
;
Sean Knight
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
2
Terahertz Materials Analysis Center and Center for III-N Technology (C3NiT)—Janzèn, Department of Physics, Chemistry and Biology (IFM), Linköping University
, 58183 Linköping, Sweden
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Alexander Ruder
;
Alexander Ruder
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
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Matthew Hilfiker
;
Matthew Hilfiker
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
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Zbigniew Galazka
;
Zbigniew Galazka
3
Leibniz-Institut für Kristallzüchtung
, 12489 Berlin, Germany
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Klaus Irmscher
;
Klaus Irmscher
3
Leibniz-Institut für Kristallzüchtung
, 12489 Berlin, Germany
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Yuxuan Zhang
;
Yuxuan Zhang
4
Department of Electrical and Computer Engineering and Department of Materials Science and Engineering, The Ohio State University
, Columbus, Ohio 43210, USA
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Hongping Zhao
;
Hongping Zhao
4
Department of Electrical and Computer Engineering and Department of Materials Science and Engineering, The Ohio State University
, Columbus, Ohio 43210, USA
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Vanya Darakchieva
;
Vanya Darakchieva
2
Terahertz Materials Analysis Center and Center for III-N Technology (C3NiT)—Janzèn, Department of Physics, Chemistry and Biology (IFM), Linköping University
, 58183 Linköping, Sweden
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Mathias Schubert
Mathias Schubert
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
2
Terahertz Materials Analysis Center and Center for III-N Technology (C3NiT)—Janzèn, Department of Physics, Chemistry and Biology (IFM), Linköping University
, 58183 Linköping, Sweden
5
Leibniz Institut für Polymerforschung e.V.
, 01069 Dresden, Germany
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Megan Stokey
1,a)
Rafał Korlacki
1
Sean Knight
1,2
Alexander Ruder
1
Matthew Hilfiker
1
Zbigniew Galazka
3
Klaus Irmscher
3
Yuxuan Zhang
4
Hongping Zhao
4
Vanya Darakchieva
2
Mathias Schubert
1,2,5
1
Department of Electrical and Computer Engineering, University of Nebraska–Lincoln
, Lincoln, Nebraska 68588, USA
2
Terahertz Materials Analysis Center and Center for III-N Technology (C3NiT)—Janzèn, Department of Physics, Chemistry and Biology (IFM), Linköping University
, 58183 Linköping, Sweden
3
Leibniz-Institut für Kristallzüchtung
, 12489 Berlin, Germany
4
Department of Electrical and Computer Engineering and Department of Materials Science and Engineering, The Ohio State University
, Columbus, Ohio 43210, USA
5
Leibniz Institut für Polymerforschung e.V.
, 01069 Dresden, Germany
a)Author to whom correspondence should be addressed: [email protected]. URL: http://ellipsometry.unl.edu
Note: This paper is part of the Special Topic on Wide Bandgap Semiconductor Materials and Devices.
J. Appl. Phys. 129, 225102 (2021)
Article history
Received:
April 01 2021
Accepted:
May 21 2021
Citation
Megan Stokey, Rafał Korlacki, Sean Knight, Alexander Ruder, Matthew Hilfiker, Zbigniew Galazka, Klaus Irmscher, Yuxuan Zhang, Hongping Zhao, Vanya Darakchieva, Mathias Schubert; Optical phonon modes, static and high-frequency dielectric constants, and effective electron mass parameter in cubic In2O3. J. Appl. Phys. 14 June 2021; 129 (22): 225102. https://doi.org/10.1063/5.0052848
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