The layered van der Waals compounds ()() were recently established as the first intrinsic magnetic topological insulators. We report a study on the epitaxial growth of films based on the co-deposition of MnTe and on (111) substrates. X-ray diffraction and scanning transmission electron microscopy evidence the formation of multilayers of stacked septuple layers and quintuple layers with a predominance of . The elemental composition and morphology of the films is further characterized by x-ray photoemission spectroscopy and atomic force microscopy. X-ray magnetic circular and linear dichroism spectra are comparable to those obtained for single crystals and confirm antiferromagnetic order in the films.
© 2020 Author(s).
2020
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