Heteroepitaxy of indium phosphide (InP) and its lattice-matched alloys on silicon (Si) show great promise for Si-based optoelectronic devices and photonic integrated circuits. Here, we report the monolithic growth of high crystalline quality InP on V-groove patterned (001) Si substrates by metalorganic chemical vapor deposition, demonstrating a low surface defect density of 4.5 × 107 cm−2, characterized by statistical electron channel contrast imaging. This advanced InP-on-Si virtual substrate is implemented by combining a compositionally graded indium gallium arsenide (InxGa1 − xAs) buffer and optimized In0.73Ga0.27As/InP strained-layer superlattices on gallium arsenide on a V-grooved Si template. These techniques gradually accommodate the lattice mismatch and effectively filter most of the generated dislocations. A comprehensive material characterization and the demonstration of room-temperature continuous-wave electrically pumped laser diodes on Si validate the suitability of using this InP-on-Si platform for monolithic integration of InP- and Si-based electronic and photonic devices.
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21 January 2020
Research Article|
January 16 2020
Defect engineering for high quality InP epitaxially grown on on-axis (001) Si
Special Collection:
Defects in Semiconductors 2020
Bei Shi
;
Bei Shi
a)
Department of Electrical and Computer Engineering, University of California Santa Barbara
, Santa Barbara, California 93106, USA
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Jonathan Klamkin
Jonathan Klamkin
a)
Department of Electrical and Computer Engineering, University of California Santa Barbara
, Santa Barbara, California 93106, USA
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Note: This paper is part of the Special Topic on Defects in Semiconductors 2020.
J. Appl. Phys. 127, 033102 (2020)
Article history
Received:
September 08 2019
Accepted:
December 29 2019
Citation
Bei Shi, Jonathan Klamkin; Defect engineering for high quality InP epitaxially grown on on-axis (001) Si. J. Appl. Phys. 21 January 2020; 127 (3): 033102. https://doi.org/10.1063/1.5127030
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