Plastic deformation in InSb single crystals is governed by the motion of dislocations. Since InSb has a diamond cubic lattice, it possesses two sets of slip planes: a shuffle set and a glide set. Transmission electron microscopy analysis of deformed bulk single crystals shows that, at low temperatures (<20 °C), dislocations have narrow cores, while at higher temperatures, they have extended cores. However, it remains unclear to which slip plane set these dislocations belong. In this paper, by combining experiments and atomic-level calculations, we show that dislocations with narrow and extended cores, respectively, belong to the shuffle and glide sets. The conclusion is reached by calculating the generalized stacking fault energy curves and ideal shear stresses using density functional theory calculations and the intrinsic stacking fault width associated with dislocations using atomistic simulations. It is also found that while the shuffle set dislocations are easier to activate at lower temperatures, dislocations on the glide set become dominant at higher temperatures.
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7 April 2020
Research Article|
April 02 2020
Atomic-level calculations and experimental study of dislocations in InSb Available to Purchase
Special Collection:
Defects in Semiconductors 2020
Anil Kumar;
Anil Kumar
1
Theoretical Division, Los Alamos National Laboratory
, Los Alamos, New Mexico 87545, USA
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Bouzid Kedjar;
Bouzid Kedjar
2
Institut Pprime, Université de Poitiers—CNRS—ENSMA, SP2MI
, 86962 Futuroscope, France
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Yanqing Su
;
Yanqing Su
a)
3
Department of Mechanical Engineering, University of California
, Santa Barbara, California 93106-5070, USA
a)Author to whom correspondence should be addressed: [email protected]
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Ludovic Thilly
;
Ludovic Thilly
2
Institut Pprime, Université de Poitiers—CNRS—ENSMA, SP2MI
, 86962 Futuroscope, France
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Irene J. Beyerlein
Irene J. Beyerlein
3
Department of Mechanical Engineering, University of California
, Santa Barbara, California 93106-5070, USA
4
Materials Department, University of California
, Santa Barbara, California 93106-5050, USA
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Anil Kumar
1
Bouzid Kedjar
2
Yanqing Su
3,a)
Ludovic Thilly
2
Irene J. Beyerlein
3,4
1
Theoretical Division, Los Alamos National Laboratory
, Los Alamos, New Mexico 87545, USA
2
Institut Pprime, Université de Poitiers—CNRS—ENSMA, SP2MI
, 86962 Futuroscope, France
3
Department of Mechanical Engineering, University of California
, Santa Barbara, California 93106-5070, USA
4
Materials Department, University of California
, Santa Barbara, California 93106-5050, USA
a)Author to whom correspondence should be addressed: [email protected]
Note: This paper is part of the Special Topic on Defects in Semiconductors 2020.
J. Appl. Phys. 127, 135104 (2020)
Article history
Received:
November 19 2019
Accepted:
March 17 2020
Citation
Anil Kumar, Bouzid Kedjar, Yanqing Su, Ludovic Thilly, Irene J. Beyerlein; Atomic-level calculations and experimental study of dislocations in InSb. J. Appl. Phys. 7 April 2020; 127 (13): 135104. https://doi.org/10.1063/1.5139285
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