Josephson junctions and superconducting quantum interference devices with graphene or other 2D materials as the weak link between superconductors have become a hot topic of research in recent years, with respect to both fundamental physics and potential applications. We have previously reported ultrawide Josephson junctions (up to 80 μm wide) based on chemical-vapor-deposition graphene where the critical current was found to be uniformly distributed in the direction perpendicular to the current. In this paper, we demonstrate that the unusually large Josephson penetration depth that this corresponds to is enabled by the unique geometric structure of Josephson junctions based on 2D materials. We derive a new expression for the Josephson penetration depth of such junctions and verify our assumptions by numerical simulations.
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7 November 2019
Research Article|
November 01 2019
Josephson penetration depth in coplanar junctions based on 2D materials
Tianyi Li
;
Tianyi Li
a)
1
London Centre for Nanotechnology, University College London
, London WC1H 0AH, United Kingdom
2
Department of Electronic and Electrical Engineering, University College London
, London WC1E 6BT, United Kingdom
3
National Physical Laboratory
, Teddington TW11 0LW, United Kingdom
4
QCD Labs and QTF Centre of Excellence, Department of Applied Physics, Aalto University
, Espoo 02150, Finland
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John C. Gallop;
John C. Gallop
3
National Physical Laboratory
, Teddington TW11 0LW, United Kingdom
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Ling Hao;
Ling Hao
3
National Physical Laboratory
, Teddington TW11 0LW, United Kingdom
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Edward J. Romans
Edward J. Romans
a)
1
London Centre for Nanotechnology, University College London
, London WC1H 0AH, United Kingdom
2
Department of Electronic and Electrical Engineering, University College London
, London WC1E 6BT, United Kingdom
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J. Appl. Phys. 126, 173901 (2019)
Article history
Received:
August 13 2019
Accepted:
October 15 2019
Citation
Tianyi Li, John C. Gallop, Ling Hao, Edward J. Romans; Josephson penetration depth in coplanar junctions based on 2D materials. J. Appl. Phys. 7 November 2019; 126 (17): 173901. https://doi.org/10.1063/1.5124391
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