In this work, the impact of roughness and amorphization on the effective thermal conductivity of silicon nanofilms and nanowires is studied with atomistic simulations. The discrepancy between simulations and experimental measurements shows that it is necessary to consider realistic roughness and amorphization to reach an agreement. We show that subnanometric roughness and specific correlation length can reduce thermal transport by a factor of two in both nanofilms and nanowires; in addition, this reduction is even more pronounced than the one related to the existence of native oxides or amorphous phases on nanostructure edges. Furthermore, an interfacial thermal resistance parallel to the heat flux is observed. This thermal resistance is increasing upon the increase of the amorphous shell thickness, reaching a maximum value for thickness of 6 nm. Our findings could improve the strategy to elaborate nanomaterials with enhanced thermoelectric efficiency by tuning thermal conductivity through the engineering of surfaces.
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28 October 2019
Research Article|
October 23 2019
Roughness and amorphization impact on thermal conductivity of nanofilms and nanowires: Making atomistic modeling more realistic
Special Collection:
Advanced Thermoelectrics
Maxime Verdier;
Maxime Verdier
1
Université de Lorraine, CNRS, LEMTA
, Nancy F-54500, France
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David Lacroix
;
David Lacroix
1
Université de Lorraine, CNRS, LEMTA
, Nancy F-54500, France
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Konstantinos Termentzidis
Konstantinos Termentzidis
a)
1
Université de Lorraine, CNRS, LEMTA
, Nancy F-54500, France
2
Univ Lyon, CNRS, INSA-Lyon, Université Claude Bernard Lyon 1
, CETHIL UMR5008, F-69621 Villeurbanne, France
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a)
Electronic mail: Konstantinos.Termentzidis@insa-lyon.fr
Note: This paper is part of the special topic on Advanced Thermoelectrics.
J. Appl. Phys. 126, 164305 (2019)
Article history
Received:
April 30 2019
Accepted:
October 04 2019
Citation
Maxime Verdier, David Lacroix, Konstantinos Termentzidis; Roughness and amorphization impact on thermal conductivity of nanofilms and nanowires: Making atomistic modeling more realistic. J. Appl. Phys. 28 October 2019; 126 (16): 164305. https://doi.org/10.1063/1.5108618
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