Bean’s critical-state model has served as the foundation for computing the heat generated by the time-varying magnetic field or current in type-II superconductors. Two key features of the Bean model are (i) the current density is either zero or at the critical value and (ii) the change in the current distribution begins at the surface. In this work, we apply the circuit model to simulate the process of charging a type-II superconductor. In addition to the self and mutual inductances among the basic units, we introduce a current-dependent longitudinal resistance to describe the critical current density, above which the conductor becomes resistive. By identifying the inductance values, we are able to reproduce the characteristic behavior of the Bean model. Specifically, we consider a superconducting slab and a superconducting wire composed of straight or twisted filaments and recover the established analytical results for these geometries. In terms of the circuit model, the behavior of the Bean model is a consequence of the geometry-specific structure of inductances and the non-linear resistances. Besides offering an intuitive explanation of the Bean model, our circuit-model calculations provide concrete examples to show that they can be used to simulate the complete charging process of multi-filament superconducting wires.
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7 March 2019
Research Article|
March 06 2019
Bean’s critical-state model as a consequence of the circuit model of non-linear resistance
Chungwei Lin
Chungwei Lin
Mitsubishi Electric Research Laboratories
, 201 Broadway, Cambridge, Massachusetts 02139, USA
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J. Appl. Phys. 125, 093904 (2019)
Article history
Received:
December 04 2018
Accepted:
February 16 2019
Citation
Chungwei Lin; Bean’s critical-state model as a consequence of the circuit model of non-linear resistance. J. Appl. Phys. 7 March 2019; 125 (9): 093904. https://doi.org/10.1063/1.5084152
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