An unexpected “twinkling” appearance of partially covered chemical vapor deposition-grown graphene on the Cu substrate, showing strong grain orientation-dependent contrast of graphene—brighter, darker, or even invisible against the oxidized substrate—was observed with a scanning electron microscope. The intricate interplay between the electron channeling contrast, oxidation layer, and the imaging parameters was discussed. Imaging conditions affording stronger mass-thickness contrast was proposed to lessen the twinkling effect and thus enable unambiguous discrimination of graphene from the substrate. The findings reported here will have important implications for the reliable characterization of graphene and other 2D materials as well as the growth mechanism study of graphene.
References
1.
X.
Li
, W.
Cai
, J.
An
, S.
Kim
, J.
Nah
, D.
Yang
, R.
Piner
, A.
Velamakanni
, I.
Jung
, and E.
Tutuc
, Science
324
(5932
), 1312
–1314
(2009
). 2.
A. N.
Obraztsov
, Nat. Nanotechnol.
4
(4
), 212
–213
(2009
). 3.
Y.
Zhang
, L.
Zhang
, and C.
Zhou
, Acc. Chem. Res.
46
(10
), 2329
–2339
(2013
). 4.
C.
Mattevi
, H.
Kim
, and M.
Chhowalla
, J. Mater. Chem.
21
(10
), 3324
–3334
(2011
). 5.
B.
Deng
, J.
Wu
, S.
Zhang
, Y.
Qi
, L.
Zheng
, H.
Yang
, J.
Tang
, L.
Tong
, J.
Zhang
, and Z.
Liu
, Small
14
, 1800725
(2018
).6.
G. H.
Han
, F.
Gunes
, J. J.
Bae
, E. S.
Kim
, S. J.
Chae
, H. J.
Shin
, J. Y.
Choi
, D.
Pribat
, and Y. H.
Lee
, Nano Lett.
11
(10
), 4144
–4148
(2011
). 7.
S. R.
Na
, X.
Wang
, R. D.
Piner
, R.
Huang
, C. G.
Willson
, and K. M.
Liechti
, ACS Nano
10
(10
), 9616
–9625
(2016
). 8.
Z.
Wang
, J.
Dong
, C.
Yi
, G.
Eres
, O.
Timpe
, F.
Qiang
, D.
Feng
, R.
Schloegl
, and M. G.
Willinger
, Nat. Commun.
7
, 13256
(2016
). 9.
R. S.
Weatherup
, B. C.
Bayer
, R.
Blume
, C.
Ducati
, C.
Baehtz
, R.
Schlögl
, and S.
Hofmann
, Nano Lett.
11
(10
), 4154
–4160
(2011
). 10.
P. R.
Kidambi
, B. C.
Bayer
, B.
Raoul
, Z. J.
Wang
, B.
Carsten
, R. S.
Weatherup
, W.
Marc-Georg
, S.
Robert
, and H.
Stephan
, Nano Lett.
13
(10
), 4769
–4778
(2013
). 11.
Y.
Momiuchi
, K.
Yamada
, H.
Kato
, Y.
Homma
, H.
Hibino
, G.
Odahara
, and C.
Oshima
, J. Phys. D Appl. Phys.
47
(45
), 455301
(2014
). 12.
R. S.
Weatherup
, A. J.
Shahani
, Z.
Wang
, K.
Mingard
, A. J.
Pollard
, M.
Georg Willinger
, R.
Schloegl
, P. W.
Voorhees
, and S.
Hofmann
, Nano Lett.
16
(10
), 6196
–6206
(2016
). 13.
Y.
Zhou
, R.
O'Connell
, P.
Maguire
, and H. Z.
Zhang
, Sci. Rep.
4
, 7032
–7037
(2014
). 14.
F.
Yang
, Y.
Liu
, W.
Wu
, W.
Chen
, L.
Gao
, and J.
Sun
, Nanotechnology
23
(47
), 475705
(2012
). 15.
J.
Xie
and J.
Spallas
, Microsc. Microanal.
19
(Suppl. 2
), 370
–371
(2013
). 16.
17.
Y.
Zhou
, D. S.
Fox
, P.
Maguire
, R.
O’Connell
, R.
Masters
, C.
Rodenburg
, H.
Wu
, M.
Dapor
, Y.
Chen
, and H. Z.
Zhang
, Sci. Rep.
6
, 21045
–21052
(2016
). 18.
L.
Huang
, D.
Zhang
, F. H.
Zhang
, Z. H.
Feng
, Y. D.
Huang
, and Y.
Gan
, Small
14
, 1704190
(2018
). 19.
H.
Hiura
, H.
Miyazaki
, and K.
Tsukagoshi
, Appl. Phys. Express
3
, 095101
(2010
). 20.
J. I.
Goldstein
, D. E.
Newbury
, P.
Echlin
, D. C.
Joy
, C. E.
Lyman
, E.
Lifshin
, L.
Sawyer
, and J. R.
Michael
, Scanning Electron Microscopy and X-Ray Microanalysis
, 3rd ed. (Kluwer Academic/Plenum, 2003
).21.
Z.
Wang
, G.
Weinberg
, Q.
Zhang
, T.
Lunkenbein
, A.
Kleinhoffmann
, M.
Kurnatowska
, M.
Plodinec
, Q.
Li
, L.
Chi
, and R.
Schloegl
, ACS Nano
9
(2
), 1506
–1519
(2015
). 22.
J. D.
Wood
, S. W.
Schmucker
, A. S.
Lyons
, E.
Pop
, and J. W.
Lyding
, Nano Lett.
11
, 4547
–4554
(2011
). 23.
B. J.
Griffin
, Scanning
33
, 162
–173
(2011
). 24.
P.
Keil
, D.
Lützenkirchenhecht
, and R.
Frahm
, AIP Conf. Proc.
882
(1
), 490
–492
(2007
). 25.
Q.
Yu
, L. A.
Jauregui
, W.
Wu
, R.
Colby
, J.
Tian
, Z.
Su
, H.
Cao
, Z.
Liu
, D.
Pandey
, and D.
Wei
, Nat. Mater.
10
(6
), 443
–449
(2011
). 26.
R.
Blume
, P. R.
Kidambi
, B. C.
Bayer
, R. S.
Weatherup
, Z. J.
Wang
, G.
Weinberg
, M. G.
Willinger
, M.
Greiner
, S.
Hofmann
, and A.
Knopgericke
, Phys. Chem. Chem. Phys.
16
(47
), 25989
–26003
(2014
). 27.
L.
Reimer
, Scanning Electron Microscopy—Physics of Image Formation and Microanalysis
, 2nd ed. (Springer Verlag
, Berlin
, 2010
).28.
C. E.
Lyman
, J. I.
Goldstein
, A. D.
Romig Jr
, P.
Echlin
, D. C.
Joy
, D. E.
Newbury
, D. B.
Williams
, J. T.
Armstrong
, C. E.
Fiori
, and E.
Lifshin
, Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
(Plenum Press
, 1990
).29.
D. C.
Joy
, D. E.
Newbury
, and D. L.
Davidson
, J. Appl. Phys.
53
(8
), R81
–R122
(1982
). 30.
M.
Dorri
, S.
Turgeon
, N.
Brodusch
, M.
Cloutier
, P.
Chevallier
, R.
Gauvin
, and D.
Mantovani
, Microsc. Microanal.
22
(5
), 997
–1006
(2016
). 31.
D. C.
Joy
and C. S.
Joy
, Micron
27
, 247
–263
(1996
). 32.
K.
Shimizu
and T.
Mitani
, New Horizons of Applied Scanning Electron Microscopy
(Springer-Verlag
, Berlin
, 2010
).2019
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