In this work, we report the experimental results obtained on a set of ∼90 nm thick FeRh epitaxial films deposited on MgO (001), MgO (111), and Al2O3 (0001) single crystal substrates. The magnetic characterization was achieved by measuring magnetization curves and ferromagnetic resonance as a function of temperature and orientation of the films with respect to the applied magnetic field. We discuss our results by comparing the characteristics of the antiferromagnetic-ferromagnetic transition among FeRh films of the same thickness but exposed to different post-growth annealings and deposited on substrates of different crystalline orientations. We have found that there is a correlation between the strain present in the films and their magnetic behavior, observing that a change in the in-plane stress from compressive to tensile tends to shift the magnetic transition by more than 60 K. The interplay between magnetic and elastic properties was further analyzed by ferromagnetic resonance, and we have found that the magnetoelastic component of the anisotropy varies from out-of-plane to in-plane, depending on the substrate. These findings could be of great importance if a precise tuning of the magnetic transition temperature or the magnetic anisotropy is needed for a specific application.
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28 August 2018
Research Article|
August 27 2018
Strain effects on the magnetic order of epitaxial FeRh thin films
H. Kumar;
H. Kumar
a)
1
Laboratório de Materiais Magnéticos, Departamento de Física dos Materiais e Mecânica, Universidade de São Paulo
, São Paulo, Brazil
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D. R. Cornejo
;
D. R. Cornejo
1
Laboratório de Materiais Magnéticos, Departamento de Física dos Materiais e Mecânica, Universidade de São Paulo
, São Paulo, Brazil
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S. L. Morelhao
;
S. L. Morelhao
2
Instituto de Física Aplicada, Universidade de São Paulo
, São Paulo, Brazil
3
Department of Physics, University of Guelph
, Guelph, Ontario N1G 1W2, Canada
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S. Kycia;
S. Kycia
3
Department of Physics, University of Guelph
, Guelph, Ontario N1G 1W2, Canada
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I. M. Montellano;
I. M. Montellano
b)
4
Instituto Balseiro (U. N. Cuyo)
, 8400 Bariloche, Río Negro, Argentina
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N. R. Álvarez;
N. R. Álvarez
5
Centro Atómico Bariloche (CNEA) and Conicet
, 8400 Bariloche, Río Negro, Argentina
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G. Alejandro;
G. Alejandro
6
Instituto de Nanociencia y Nanotecnología (CNEA-Conicet), Centro Atómico Bariloche
, 8400 Bariloche, Río Negro, Argentina
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a)
Present address: Department of Sciences and Humanities, NIT Uttarakhand, Srinagar 246174, India.
b)
Present address: Max Planck Institut fur Plasmaphysik, Garching bei Munchen, Germany.
c)
Electronic mail: [email protected]
J. Appl. Phys. 124, 085306 (2018)
Article history
Received:
December 20 2017
Accepted:
July 26 2018
Citation
H. Kumar, D. R. Cornejo, S. L. Morelhao, S. Kycia, I. M. Montellano, N. R. Álvarez, G. Alejandro, A. Butera; Strain effects on the magnetic order of epitaxial FeRh thin films. J. Appl. Phys. 28 August 2018; 124 (8): 085306. https://doi.org/10.1063/1.5020160
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