Fumed silica with a specific area of 295 m2/g was carbonized by successive phenyltrimethoxysilane treatments followed by annealing in inert atmosphere up to 650 °C. Emission, excitation, kinetics, and photo-induced bleaching effects were investigated by steady state and time-resolved photoluminescence spectroscopies. The local chemistry was also studied by infrared transmission spectroscopy. Strong ultraviolet and visible photoluminescence was observed in the samples after the chemical treatments/modifications and thermal annealing. It has been shown that ultraviolet photoluminescence in chemically modified fumed silica is associated with phenyl groups, while near ultraviolet and visible emission in annealed samples originated from inorganic pyrolytic carbon precipitates dispersed in the silica host matrix. Two types of emission bands were identified as a function of the annealing temperature: one is in the near UV and the other is in the visible range. Based on the emission/excitation analysis of these two bands, as well as on correlations with the synthesis conditions, a structural-energy concept of light-emitting centers has been proposed. According to this model, the light-emitting centers are associated with carbon clusters that can be bonded or adsorbed on the silica surface. This has been validated by a detailed (S)TEM-electron energy-loss spectroscopy study, confirming the inhomogeneous distribution of nanoscale carbon precipitates at the surface of the silica nanoparticles. These carbon precipitates are mostly amorphous although they possess some degree of graphitization and local order. Finally, the fraction of sp2 carbon in these nanoclusters has been estimated to be close to 80%.
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14 September 2018
Research Article|
September 14 2018
Multiband light emission and nanoscale chemical analyses of carbonized fumed silica Available to Purchase
A. V. Vasin;
A. V. Vasin
1
Lashkaryov Institute of Semiconductor Physics
, Kyiv, Ukraine
2
National Technical University of Ukraine “I. Sikorsky KPI”
, Kyiv, Ukraine
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D. V. Kysil;
D. V. Kysil
1
Lashkaryov Institute of Semiconductor Physics
, Kyiv, Ukraine
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L. Lajaunie
;
L. Lajaunie
3
Laboratorio de Microscopías Avanzadas, Instituto de Nanociencia de Aragon, Universidad de Zaragoza
, 50018 Zaragoza, Spain
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G. Yu. Rudko;
G. Yu. Rudko
1
Lashkaryov Institute of Semiconductor Physics
, Kyiv, Ukraine
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V. S. Lysenko;
V. S. Lysenko
1
Lashkaryov Institute of Semiconductor Physics
, Kyiv, Ukraine
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S. V. Sevostianov;
S. V. Sevostianov
4
Chuiko Institute of Surface Chemistry
, Kyiv, Ukraine
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V. A. Tertykh;
V. A. Tertykh
4
Chuiko Institute of Surface Chemistry
, Kyiv, Ukraine
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Yu. P. Piryatinski;
Yu. P. Piryatinski
5
Institute of Physics
, Kyiv, Ukraine
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M. Cannas
;
M. Cannas
6
Dipartimento di Fisica e Chimica, Universita degli Studi di Palermo
, I-90123 Palermo, Italy
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L. Vaccaro;
L. Vaccaro
6
Dipartimento di Fisica e Chimica, Universita degli Studi di Palermo
, I-90123 Palermo, Italy
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R. Arenal;
R. Arenal
a)
3
Laboratorio de Microscopías Avanzadas, Instituto de Nanociencia de Aragon, Universidad de Zaragoza
, 50018 Zaragoza, Spain
7
ARAID Foundation
, 50018 Zaragoza, Spain
a)Authors to whom correspondence should be addressed: [email protected], Tel.: +34 976 762 985 and [email protected], Tel.: +380 (44) 525 61 77.
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A. N. Nazarov
A. N. Nazarov
a)
1
Lashkaryov Institute of Semiconductor Physics
, Kyiv, Ukraine
2
National Technical University of Ukraine “I. Sikorsky KPI”
, Kyiv, Ukraine
a)Authors to whom correspondence should be addressed: [email protected], Tel.: +34 976 762 985 and [email protected], Tel.: +380 (44) 525 61 77.
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A. V. Vasin
1,2
D. V. Kysil
1
L. Lajaunie
3
G. Yu. Rudko
1
V. S. Lysenko
1
S. V. Sevostianov
4
V. A. Tertykh
4
Yu. P. Piryatinski
5
M. Cannas
6
L. Vaccaro
6
R. Arenal
3,7,a)
A. N. Nazarov
1,2,a)
1
Lashkaryov Institute of Semiconductor Physics
, Kyiv, Ukraine
2
National Technical University of Ukraine “I. Sikorsky KPI”
, Kyiv, Ukraine
3
Laboratorio de Microscopías Avanzadas, Instituto de Nanociencia de Aragon, Universidad de Zaragoza
, 50018 Zaragoza, Spain
4
Chuiko Institute of Surface Chemistry
, Kyiv, Ukraine
5
Institute of Physics
, Kyiv, Ukraine
6
Dipartimento di Fisica e Chimica, Universita degli Studi di Palermo
, I-90123 Palermo, Italy
7
ARAID Foundation
, 50018 Zaragoza, Spain
a)Authors to whom correspondence should be addressed: [email protected], Tel.: +34 976 762 985 and [email protected], Tel.: +380 (44) 525 61 77.
J. Appl. Phys. 124, 105108 (2018)
Article history
Received:
June 03 2018
Accepted:
August 26 2018
Citation
A. V. Vasin, D. V. Kysil, L. Lajaunie, G. Yu. Rudko, V. S. Lysenko, S. V. Sevostianov, V. A. Tertykh, Yu. P. Piryatinski, M. Cannas, L. Vaccaro, R. Arenal, A. N. Nazarov; Multiband light emission and nanoscale chemical analyses of carbonized fumed silica. J. Appl. Phys. 14 September 2018; 124 (10): 105108. https://doi.org/10.1063/1.5042671
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