We investigate the effect of band-limited white Gaussian noise (BLWGN) on electromagnetically induced transparency (EIT) and Autler-Townes (AT) splitting, when performing atom-based continuous-wave (CW) radio-frequency (RF) electric (E) field strength measurements with Rydberg atoms in an atomic vapor. This EIT/AT-based E-field measurement approach is currently being investigated by several groups around the world as a means to develop a new International System of Units traceable RF E-field measurement technique. For this to be a useful technique, it is important to understand the influence of BLWGN. We perform EIT/AT based E-field experiments with BLWGN centered on the RF transition frequency and for the BLWGN blue-shifted and red-shifted relative to the RF transition frequency. The EIT signal can be severely distorted for certain noise conditions (bandwidth, center frequency, and noise power), hence altering the ability to accurately measure a CW RF E-field strength. We present a model to predict the line shifts and broadenings in the EIT signal in the presence of noise. This model includes AC Stark shifts and on resonance transitions associated with the noise source. The results of this model are compared to the experimental data, and we find very good agreement between the two.
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28 May 2018
Research Article|
May 31 2018
Electromagnetically Induced Transparency (EIT) and Autler-Townes (AT) splitting in the presence of band-limited white Gaussian noise
Matthew T. Simons;
Matthew T. Simons
1
National Institute of Standards and Technology (NIST)
, Boulder, Colorado 80305, USA
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Marcus D. Kautz;
Marcus D. Kautz
1
National Institute of Standards and Technology (NIST)
, Boulder, Colorado 80305, USA
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Christopher L. Holloway;
Christopher L. Holloway
a)
1
National Institute of Standards and Technology (NIST)
, Boulder, Colorado 80305, USA
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David A. Anderson
;
David A. Anderson
2
Rydberg Technologies, LLC
, Ann Arbor, Michigan 48104, USA
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Georg Raithel;
Georg Raithel
2
Rydberg Technologies, LLC
, Ann Arbor, Michigan 48104, USA
3
Department of Physics, University of Michigan
, Ann Arbor, Michigan 48109, USA
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Daniel Stack;
Daniel Stack
4
The MITRE Corporation
, Princeton, New Jersey 08540, USA
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Marc C. St. John;
Marc C. St. John
5
The MITRE Corporation
, McLean, Virginia 22102, USA
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Wansheng Su
Wansheng Su
5
The MITRE Corporation
, McLean, Virginia 22102, USA
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J. Appl. Phys. 123, 203105 (2018)
Article history
Received:
December 20 2017
Accepted:
May 08 2018
Citation
Matthew T. Simons, Marcus D. Kautz, Christopher L. Holloway, David A. Anderson, Georg Raithel, Daniel Stack, Marc C. St. John, Wansheng Su; Electromagnetically Induced Transparency (EIT) and Autler-Townes (AT) splitting in the presence of band-limited white Gaussian noise. J. Appl. Phys. 28 May 2018; 123 (20): 203105. https://doi.org/10.1063/1.5020173
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