Minority carrier diffusion lengths and lifetimes were determined for p-type Ga(1-x)InxAs with an In-content of 0 ≤ x ≤ 0.53 by cathodoluminescence and time-resolved photoluminescence measurements respectively under low injection conditions; the resulting minority carrier mobilities are also reported. Highly p-doped samples (3 × 1018 cm−3) demonstrate a constant minority carrier diffusion length of (5.0 ± 0.7) μm and a constant lifetime of (3.7 ± 0.7) ns for an In-content up to 21%. Lower doped samples (3 × 1017 cm−3), on the other hand, show an increase in minority carrier diffusion length and lifetime with In-content from (6.3 ± 0.2) μm and (6.2 ± 0.5) ns respectively for GaAs to (14 ± 2) μm and (24.4 ± 0.5) ns respectively for Ga0.79In0.21As. Increasing the In-content to 53% results in a drop in the minority carrier diffusion length independently of the p-doping concentration .This is interpreted as a change in the energy of the Shockley-Read-Hall trap levels within the bandgap as a function of indium concentration.
Minority carrier diffusion length, lifetime and mobility in p-type GaAs and GaInAs
M. Niemeyer, J. Ohlmann, A. W. Walker, P. Kleinschmidt, R. Lang, T. Hannappel, F. Dimroth, D. Lackner; Minority carrier diffusion length, lifetime and mobility in p-type GaAs and GaInAs. J. Appl. Phys. 21 September 2017; 122 (11): 115702. https://doi.org/10.1063/1.5002630
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