Thin layers of MnSi, the first discovered host material of a skyrmion lattice, are epitaxially grown on Si(111) and their crystal properties are investigated by X-ray diffraction and transmission electron microscopy (TEM) measurements. Azimuthal -scans of asymmetric X-ray reflections reveal the formation of twinned domains with their unit cell rotated in plane with respect to the Si unit cell. The intensities of corresponding reflections indicate the same volume fractions for both domain types. Cross-sectional TEM confirms the presence of these domains and reveals a typical domain size of about 200 nm.
Twin domains in epitaxial thin MnSi layers on Si(111)
M. Trabel, N. V. Tarakina, C. Pohl, J. A. Constantino, C. Gould, K. Brunner, L. W. Molenkamp; Twin domains in epitaxial thin MnSi layers on Si(111). J. Appl. Phys. 28 June 2017; 121 (24): 245310. https://doi.org/10.1063/1.4990284
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