In this study, we provide insights into planar structure methylammonium lead triiodide (MAPbI3) perovskite solar cells (PSCs) using electroluminescence and photoluminescence imaging techniques. We demonstrate the strength of these techniques in screening relatively large area PSCs, correlating the solar cell electrical parameters to the images and visualizing the features which contribute to the variation of the parameters extracted from current density-voltage characterizations. It is further used to investigate one of the major concerns about perovskite solar cells, their long term stability and aging. Upon storage under dark in dry glovebox condition for more than two months, the major parameter found to have deteriorated in electrical performance measurements was the fill factor; this was elucidated via electroluminescence image comparisons which revealed that the contacts' quality degrades. Interestingly, by deploying electroluminescence imaging, the significance of having a pin-hole free active layer is demonstrated. Pin-holes can grow over time and can cause degradation of the active layer surrounding them.
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21 July 2016
Research Article|
July 20 2016
Electro- and photoluminescence imaging as fast screening technique of the layer uniformity and device degradation in planar perovskite solar cells
Arman Mahboubi Soufiani;
Arman Mahboubi Soufiani
a)
1Australian Centre for Advanced Photovoltaics, School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales
, Sydney, NSW 2052, Australia
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Murad J. Y. Tayebjee;
Murad J. Y. Tayebjee
1Australian Centre for Advanced Photovoltaics, School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales
, Sydney, NSW 2052, Australia
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Steffen Meyer;
Steffen Meyer
2School of Chemistry,
Monash University
, Clayton, VIC 3800, Australia
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Anita Ho-Baillie;
Anita Ho-Baillie
1Australian Centre for Advanced Photovoltaics, School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales
, Sydney, NSW 2052, Australia
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Jae Sung Yun;
Jae Sung Yun
1Australian Centre for Advanced Photovoltaics, School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales
, Sydney, NSW 2052, Australia
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Rowan W. MacQueen;
Rowan W. MacQueen
b)
3School of Chemistry,
University of Sydney
, Sydney, NSW 2006, Australia
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Leone Spiccia;
Leone Spiccia
2School of Chemistry,
Monash University
, Clayton, VIC 3800, Australia
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Martin A. Green;
Martin A. Green
1Australian Centre for Advanced Photovoltaics, School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales
, Sydney, NSW 2052, Australia
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Ziv Hameiri
Ziv Hameiri
a)
1Australian Centre for Advanced Photovoltaics, School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales
, Sydney, NSW 2052, Australia
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a)
Electronic addresses: [email protected] and [email protected]
b)
Current address: Institute for Nanospectroscopy, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany
J. Appl. Phys. 120, 035702 (2016)
Article history
Received:
April 11 2016
Accepted:
June 27 2016
Connected Content
Citation
Arman Mahboubi Soufiani, Murad J. Y. Tayebjee, Steffen Meyer, Anita Ho-Baillie, Jae Sung Yun, Rowan W. MacQueen, Leone Spiccia, Martin A. Green, Ziv Hameiri; Electro- and photoluminescence imaging as fast screening technique of the layer uniformity and device degradation in planar perovskite solar cells. J. Appl. Phys. 21 July 2016; 120 (3): 035702. https://doi.org/10.1063/1.4956436
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