We present a versatile nanomechanical sensing platform for the investigation of magnetostriction in thin films. It is based on a doubly clamped silicon nitride nanobeam resonator covered with a thin magnetostrictive film. Changing the magnetization direction within the film plane by an applied magnetic field generates a magnetoelastic stress and thus changes the resonance frequency of the nanobeam. A measurement of the resulting resonance frequency shift, e.g., by optical interferometry, allows to quantitatively determine the magnetostriction constants of the thin film. In a proof-of-principle experiment, we determine the magnetostriction constants of a 10 nm thick polycrystalline cobalt film, showing very good agreement with literature values. The presented technique aims, in particular, for the precise measurement of magnetostriction in a variety of (conducting and insulating) thin films, which can be deposited by, e.g., electron beam deposition, thermal evaporation, or sputtering.
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7 March 2016
Research Article|
March 01 2016
A versatile platform for magnetostriction measurements in thin films
M. Pernpeintner;
M. Pernpeintner
a)
1
Walther-Meißner-Institut
, Bayerische Akademie der Wissenschaften, D-85748 Garching, Germany
2
Nanosystems Initiative Munich
, Schellingstraße 4, D-80799 München, Germany
3Physik-Department,
Technische Universität München
, D-85748 Garching, Germany
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R. B. Holländer;
R. B. Holländer
b)
1
Walther-Meißner-Institut
, Bayerische Akademie der Wissenschaften, D-85748 Garching, Germany
3Physik-Department,
Technische Universität München
, D-85748 Garching, Germany
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M. J. Seitner;
M. J. Seitner
4Department of Physics,
University of Konstanz
, D-78457 Konstanz, Germany
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E. M. Weig;
E. M. Weig
4Department of Physics,
University of Konstanz
, D-78457 Konstanz, Germany
5Center for NanoScience (CeNS) and Fakultät für Physik,
Ludwig-Maximilians-Universität München
, D-80799 München, Germany
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R. Gross;
R. Gross
1
Walther-Meißner-Institut
, Bayerische Akademie der Wissenschaften, D-85748 Garching, Germany
2
Nanosystems Initiative Munich
, Schellingstraße 4, D-80799 München, Germany
3Physik-Department,
Technische Universität München
, D-85748 Garching, Germany
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S. T. B. Goennenwein;
S. T. B. Goennenwein
1
Walther-Meißner-Institut
, Bayerische Akademie der Wissenschaften, D-85748 Garching, Germany
2
Nanosystems Initiative Munich
, Schellingstraße 4, D-80799 München, Germany
3Physik-Department,
Technische Universität München
, D-85748 Garching, Germany
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H. Huebl
H. Huebl
c)
1
Walther-Meißner-Institut
, Bayerische Akademie der Wissenschaften, D-85748 Garching, Germany
2
Nanosystems Initiative Munich
, Schellingstraße 4, D-80799 München, Germany
3Physik-Department,
Technische Universität München
, D-85748 Garching, Germany
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a)
Electronic mail: matthias.pernpeintner@wmi.badw.de.
b)
Present address: Institute for Materials Science, Christian-Albrechts-Universität zu Kiel, D-24143 Kiel, Germany.
c)
Electronic mail: huebl@wmi.badw.de.
J. Appl. Phys. 119, 093901 (2016)
Article history
Received:
January 25 2016
Accepted:
February 10 2016
Citation
M. Pernpeintner, R. B. Holländer, M. J. Seitner, E. M. Weig, R. Gross, S. T. B. Goennenwein, H. Huebl; A versatile platform for magnetostriction measurements in thin films. J. Appl. Phys. 7 March 2016; 119 (9): 093901. https://doi.org/10.1063/1.4942531
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