In this work, we analyze the behavior of the band-to-band tunneling distance between electron and hole subbands resulting from field-induced quantum confinement in the heterogate electron–hole bilayer tunnel field-effect transistor. We show that, analogously to the explicit formula for the tunneling distance that can be easily obtained in the semiclassical framework where the conduction and valence band edges are allowed states, an equivalent analytical expression can be derived in the presence of field-induced quantum confinement for describing the dependence of the tunneling distance on the body thickness and material properties of the channel. This explicit expression accounting for quantum confinement holds valid provided that the potential wells for electrons and holes at the top and bottom of the channel can be approximated by triangular profiles. Analytical predictions are compared to simulation results showing very accurate agreement.

1.
A. C.
Seabaugh
and
Q.
Zhang
,
Proc. IEEE
98
,
2095
(
2010
).
2.
R.
Asra
,
M.
Shrivastava
,
K. V. R. M.
Murali
,
R. K.
Pandey
,
H.
Gossner
, and
V. R.
Rao
,
IEEE Trans. Electron Devices
58
,
1855
(
2011
).
3.
R.
Gandhi
,
Z.
Chen
,
N.
Singh
,
K.
Banerjee
, and
S.
Lee
,
IEEE Electron Device Lett.
32
,
437
(
2011
).
4.
G.
Dewey
,
B.
Chu-Kung
,
J.
Boardman
,
J. M.
Fastenau
,
J.
Kavalieros
,
R.
Kotlyar
,
W. K.
Liu
,
D.
Lubyshev
,
M.
Metz
,
N.
Mukherjee
,
P.
Oakey
,
R.
Pillarisetty
,
M.
Radosavljevic
,
H. W.
Then
, and
R.
Chau
,
Proc. IEEE Int. Electron Devices Meet. (IEDM)
2011
,
33.6.1
33.6.4
(
2011
).
5.
S.
Agarwal
,
J. T.
Teherani
,
J. L.
Hoyt
,
D. A.
Antoniadis
, and
E.
Yablonovitch
,
IEEE Trans. Electron Devices
61
,
1599
(
2014
).
6.
M.
Schmidt
,
A.
Schäfer
,
R. A.
Minamisawa
,
D.
Buca
,
S.
Trellenkamp
,
J. M.
Hartmann
,
Q. T.
Zhao
, and
S.
Mantl
,
IEEE Electron Device Lett.
35
,
699
(
2014
).
7.
M.
Liu
,
Y.
Liu
,
H.
Wang
,
Q.
Zhang
,
C.
Zhang
,
S.
Hu
,
Y.
Hao
, and
G.
Han
,
IEEE Trans. Electron Devices
62
,
1262
(
2015
).
8.
U. E.
Avci
,
D. H.
Morris
, and
Y. A.
Young
,
IEEE J. Electron Devices Soc.
3
,
88
(
2015
).
9.
L.
De Michielis
,
L.
Lattanzio
,
P.
Palestri
,
L.
Selmi
, and
A. M.
Ionescu
, in
Proceedings of the 69th Annual IEEE DRC
(
2011
), pp.
111
112
.
10.
Y.
Lu
,
G.
Zhou
,
R.
Li
,
Q.
Liu
,
Q.
Zhang
,
T.
Vasen
,
S. D.
Chae
,
T.
Kosel
,
M.
Wistey
,
H.
Xing
,
A.
Seabaugh
, and
P.
Fay
,
IEEE Electron Device Lett.
33
,
655
(
2012
).
11.
I. A.
Fischer
,
A. S. M.
Bakibillah
,
M.
Golve
,
D.
Hahnel
,
H.
Isemann
,
A.
Kottantharayil
,
M.
Oehme
, and
J.
Schulze
,
IEEE Electron Device Lett.
34
,
154
(
2013
).
12.
S.
Agarwal
and
E.
Yablonovitch
, in
69th Annual DRC
(
2011
), pp.
199
200
.
13.
L.
Lattanzio
,
L.
De Michielis
, and
A. M.
Ionescu
,
IEEE Electron Device Lett.
33
,
167
(
2012
).
14.
C.
Alper
,
L.
Lattanzio
,
L.
De Michielis
,
P.
Palestri
,
L.
Selmi
, and
A. M.
Ionescu
,
IEEE Trans. Electron Devices
60
,
2754
(
2013
).
15.
W.
Vandenberghe
,
B.
Soree
,
W.
Magnus
,
G.
Groeseneken
, and
M.
Fischetti
,
Appl. Phys. Lett.
98
,
143503
(
2011
).
16.
J. L.
Padilla
,
F.
Gamiz
, and
A.
Godoy
,
IEEE Electron Device Lett.
33
,
1342
(
2012
).
17.
A. M.
Walke
,
A. S.
Verhulst
,
A.
Vandooren
,
D.
Verreck
,
E.
Simoen
,
V. R.
Rao
,
G.
Groeseneken
,
N.
Collaert
, and
A. V. Y.
Thean
,
IEEE Trans. Electron Devices
60
,
4057
(
2013
).
18.
J. L.
Padilla
,
C.
Alper
,
F.
Gamiz
, and
A. M.
Ionescu
,
Appl. Phys. Lett.
105
,
082108
(
2014
).
19.
C.
Alper
,
P.
Palestri
,
L.
Lattanzio
,
J. L.
Padilla
, and
A. M.
Ionescu
, in
Proceedings of the ESSDERC
(
2014
), pp.
186
189
.
20.
W.
Hsu
,
J.
Mantley
,
L. F.
Register
, and
S. K.
Banerjee
,
Appl. Phys. Lett.
106
,
026102
(
2015
).
21.
J. L.
Padilla
,
C.
Alper
,
F.
Gamiz
, and
A. M.
Ionescu
,
Appl. Phys. Lett.
106
,
026103
(
2015
).
22.
J. L.
Padilla
,
C.
Alper
,
F.
Gamiz
, and
A. M.
Ionescu
,
IEEE Trans. Electron Devices
62
,
3560
(
2015
).
23.
J. L.
Padilla
,
C.
Alper
,
C.
Medina-Bailon
,
F.
Gamiz
, and
A. M.
Ionescu
,
Appl. Phys. Lett.
106
,
262102
(
2015
).
24.
I. N.
Bronshtein
,
K. A.
Semendyayev
,
G.
Musiol
, and
H.
Muehlig
,
Handbook of Mathematics
, 5th ed. (
Springer-Verlag
,
Berlin, Heidelberg
,
2007
).
25.
J. L.
Padilla
,
F.
Gamiz
, and
A.
Godoy
,
IEEE Trans. Electron Devices
59
,
3205
(
2012
).
26.
A.
Biswas
,
L.
De Michielis
,
A.
Bazigos
, and
A. M.
Ionescu
, in
Proceedings of the ESSDERC
(
2015
),
pp.
40
43
.
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