We report the effect of varying cobalt thickness on the temperature-dependent time decay of the electrical resistance of Co/Sb multilayer samples. We find that for a given temperature, a five fold change in the Co thickness produces a 100 fold change in the characteristic decay time of the resistance. We find that the characteristic decay time, as a function of temperature, follows an Arrhenius law. During deposition, the Co evolves single domain magnetic nanoparticles, on the Sb, in either a Volmer-Weber or Stranski-Krastanov growth mode. This metastable state is then encased in 2.5 nm of Sb producing an embedded nanoparticle system. Scanning tunneling microscopy measurements taken before sample aging (annealing at a given temperature for enough time to complete the resistance decay) and after aging show that these nanoparticles undergo morphological transformations during aging. These transformations lead to well defined time dependent decays in both the magnetization and the electrical resistance, making this material an excellent candidate for an electronic time-temperature sensor.

1.
Nanoelectronics and Information Technology
, 3rd ed., edited by
R.
Waser
(
Wiley
,
2012
).
2.
P. N.
Prasad
,
Nanophotonics
(
Wiley
,
2004
).
3.
P. N.
Prasad
,
Introduction to Nanomedicine and Nanobioengineering
(
John Wiley and Sons
,
2012
).
4.
G. G.
Kenning
,
C.
Heidt
,
A.
Barnes
,
J.
Martin
,
B.
Grove
, and
M.
Madden
,
J. Appl. Phys.
110
,
114312
(
2011
).
5.
G. G.
Kenning
, in
IEEE International Conference on RFID (IEEE RFID)
, April 2014, pp.
134
140
.
6.
L.
Lu
,
W.
Zheng
,
Z.
Lv
, and
Y.
Tang
, in
Chinese Packaging Institute - 2012 Conference
,
2012
.
7.
G. L.
Robertson
,
Food Packaging: Principles and Practice
(
Marcel Dekker
,
New York
,
1993
), p.
375
.
8.
D.
Gunders
, Wasted: How America is Losing up to 40 Percent of its Food from Farm to Fork to Landfill, Natural Resources Defense Council,
2012
, see http://www.nrdc.org/food/files/wasted-food-IP.pdf
9.
S.
Arrhenius
,
Z. Phys. Chem.
4
,
226
(
1889
);
S. R.
Logan
,
J. Chem. Educ.
59
(
4
),
279
(
1982
).
10.
T. P.
Labuza
,
J. Chem. Educ.
61
(
4
),
348
(
1984
).
11.
L.
Neel
,
Ann. Geophys.
5
,
99
136
(
1949
).
12.
L. C. E.
Struik
,
Physical Aging in Amorphous Polymers and Other Materials/L. C. E
(
Struik Elsevier Scientific Pub. Co.
,
1978
).
13.
R. V.
Chamberlin
,
M.
Hardiman
, and
R.
Orbach
,
J. Appl. Phys.
52
,
1771
(
1981
);
L.
Lundgren
,
P.
Svedlindh
,
P.
Nordblad
, and
O.
Beckman
,
Phys. Rev. Lett.
51
,
911
(
1983
).
14.
A.
Amir
,
Y.
Oreg
, and
Y.
Imry
,
Phys. Rev. B
77
,
165207
(
2008
), and reference there in.
15.
C.
Heidt
, “
Production and characterization of CoFe/Sb metallic multilayer systems
,” M.S. thesis, Indiana University of Pennsylvania,
2009
.
16.
J.-P.
Issi
,
Aust. J. Phys.
32
,
585
(
1979
).
17.
Y.
Liu
and
R. E.
Allen
,
Phys. Rev. B
52
,
1566
(
1995
).
18.
J.
Heremans
,
C. M.
Thrush
,
Y.-M.
Lin
,
S. B.
Cronin
, and
M. S.
Dresselhaus
,
Phys. Rev. B
63
,
085406
(
2001
).
19.
Table corrected from Ref. 5.
20.
B. I.
Halperin
and
T. M.
Rice
,
Rev. Mod. Phys.
40
,
755
(
1968
).
21.
S.
Rani
and
G.
Chadha
,
Indian J. Pure Appl. Phys.
40
(
06
),
59
–64 (
2002
), and reference therein.
22.
H.
Suderow
,
I.
Guillamon
,
J. G.
Rodrigo
, and
S.
Vieira
,
Supercond. Sci. Technol.
27
,
063001
(
2014
);
J.
Tersoff
and
D. R.
Hamann
,
Phys. Rev. Lett.
50
,
1998
(
1983
);
J.
Tersoff
and
D. R.
Hamann
,
Phys. Rev. B
31
,
805
(
1985
);
O. J.
Bardeen
,
Phys. Rev. Lett.
6
,
57
(
1961
).
23.
W. P.
Halperin
,
Rev. Mod. Phys.
58
(
3
),
533
607
(
1986
).
24.
G. G.
Kenning
,
K.
Reaz
,
S.
Hensley
, and
T.
Alshammary
, “
Variation of Sb Layer Thickness and AFM, MFM and TEM Microscopy of Co nanoparticles embedded in Sb
” (unpublished).
25.
J. K.
Kawasaki
,
R.
Timm
,
K. T.
Delaney
,
E.
Lundgren
,
A.
Mikkelsen
, and
C. J.
Palmstrøm
,
Phys. Rev. Lett.
107
,
036806
(
2011
).
26.
T.
Komesu
,
C. N.
Borca
,
H.-K.
Jeong
,
P. A.
Dowben
,
D.
Ristoiu
,
J. P.
Nozie'res
,
Sh.
Stadler
, and
Y. U.
Idzerda
,
Phys. Lett. A
273
,
245
(
2000
);
R.
Skomski
,
T.
Komesu
,
C. N.
Borca
,
H.-K.
Jeong
,
P. A.
Dowben
,
D.
Ristoiu
, and
J. P.
Nozie'res
,
J. Appl. Phys.
89
(
11
),
7275
(
2001
).
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