In this study 2d two phase microstructures closely resembling the experimentally captured micrographs of the interpenetrating phase composites are generated using a Gaussian correlation function based method. The scale dependent bounds on the effective thermal conductivity of such microstructures are then studied using Hill-Mandel boundary conditions. A scaling function is formulated to describe the transition from statistical volume element (SVE) to representative volume element (RVE), as a function of the mesoscale δ, the correlation length of the Gaussian correlation function λ, the volume fraction v, and the contrast k between the phases. The scaling function is determined through fitting the data from extensive simulations conducted over the parameter space. The scaling function shows that SVE approaches RVE as . A material scaling diagram allows estimation of the RVE size, to within a chosen accuracy, of a given microstructure characterized by the correlation length of the Gaussian correlation function, contrast, and volume fraction of the phases.
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14 March 2015
Research Article|
March 10 2015
Scaling and bounds in thermal conductivity of planar Gaussian correlated microstructures
Sohan Kale;
Sohan Kale
1Department of Mechanical Science and Engineering, NSF Center for Novel High Voltage/Temperature Materials and Structures, Institute for Condensed Matter Theory, and Beckman Institute,
University of Illinois at Urbana-Champaign
, Champaign, Urbana 61801, USA
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Ankit Saharan;
Ankit Saharan
1Department of Mechanical Science and Engineering, NSF Center for Novel High Voltage/Temperature Materials and Structures, Institute for Condensed Matter Theory, and Beckman Institute,
University of Illinois at Urbana-Champaign
, Champaign, Urbana 61801, USA
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Seid Koric;
Seid Koric
1Department of Mechanical Science and Engineering, NSF Center for Novel High Voltage/Temperature Materials and Structures, Institute for Condensed Matter Theory, and Beckman Institute,
University of Illinois at Urbana-Champaign
, Champaign, Urbana 61801, USA
2National Center for Supercomputing Applications,
University of Illinois at Urbana-Champaign
, 1205 W. Clark St., Urbana, Illinois 61801, USA
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Martin Ostoja-Starzewski
Martin Ostoja-Starzewski
a)
1Department of Mechanical Science and Engineering, NSF Center for Novel High Voltage/Temperature Materials and Structures, Institute for Condensed Matter Theory, and Beckman Institute,
University of Illinois at Urbana-Champaign
, Champaign, Urbana 61801, USA
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a)
Electronic mail: [email protected]
J. Appl. Phys. 117, 104301 (2015)
Article history
Received:
January 23 2015
Accepted:
February 24 2015
Citation
Sohan Kale, Ankit Saharan, Seid Koric, Martin Ostoja-Starzewski; Scaling and bounds in thermal conductivity of planar Gaussian correlated microstructures. J. Appl. Phys. 14 March 2015; 117 (10): 104301. https://doi.org/10.1063/1.4914128
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