Density functional based simulation, corrected for finite size effects, is used to investigate systematically the formation of antisite defects in III-V semiconductors (III = Al, Ga, and In and V = P, As, and Sb). Different charge states are modelled as a function of the Fermi level and under different growth conditions. The formation energies of group III antisites () decrease with increasing covalent radius of the group V atom though not group III radius, whereas group V antisites () show a consistent decrease in formation energies with increase in group III and group V covalent radii. In general, defects dominate under III-rich conditions and under V-rich conditions. Comparison with equivalent vacancy formation energy simulations shows that while antisite concentrations are always dominant under stoichiometric conditions, modest variation in growth or doping conditions can lead to a significantly higher concentration of vacancies.
Skip Nav Destination
Article navigation
14 July 2014
Research Article|
July 09 2014
Antisites in III-V semiconductors: Density functional theory calculations
A. Chroneos;
A. Chroneos
a)
1Engineering and Innovation,
The Open University
, Milton Keynes MK7 6AA, United Kingdom
Search for other works by this author on:
H. A. Tahini;
H. A. Tahini
2Department of Materials,
Imperial College London
, London SW7 2AZ, United Kingdom
3PSE Division,
KAUST
, Thuwal 23955-6900, Kingdom of Saudi Arabia
Search for other works by this author on:
U. Schwingenschlögl;
U. Schwingenschlögl
b)
3PSE Division,
KAUST
, Thuwal 23955-6900, Kingdom of Saudi Arabia
Search for other works by this author on:
R. W. Grimes
R. W. Grimes
c)
2Department of Materials,
Imperial College London
, London SW7 2AZ, United Kingdom
Search for other works by this author on:
J. Appl. Phys. 116, 023505 (2014)
Article history
Received:
June 06 2014
Accepted:
June 24 2014
Citation
A. Chroneos, H. A. Tahini, U. Schwingenschlögl, R. W. Grimes; Antisites in III-V semiconductors: Density functional theory calculations. J. Appl. Phys. 14 July 2014; 116 (2): 023505. https://doi.org/10.1063/1.4887135
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00