The structural and optical properties of pentenary alloy (Ag,Cu)(In,Ga)Se2 polycrystalline thin films were characterized over the entire compositional range at a fixed (Cu + Ag)/(In + Ga) ratio. Films deposited at 550 °C on bare and molybdenum coated soda-lime glass by elemental co-evaporation in a single-stage process with constant incident fluxes exhibit single phase chalcopyrite structure, corresponding to 122 spacegroup (I-42d) over the entire compositional space. Unit cell refinement of the diffraction patterns show that increasing Ag substitution for Cu, the refined ao lattice constant, (Ag,Cu)-Se bond length, and anion displacement increase in accordance with the theoretical model proposed by Jaffe, Wei, and Zunger. However, the refined co lattice constant and (In,Ga)-Se bond length deviated from theoretical expectations for films with mid-range Ag and Ga compositions and are attributed to influences from crystallographic bond chain ordering or cation electronegativity. The optical band gap, derived from transmission and reflection measurements, widened with increasing Ag and Ga content, due to influences from anion displacement and cation electronegativity, as expected from theoretical considerations for pseudo-binary chalcopyrite compounds.
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14 June 2014
Research Article|
June 09 2014
Structural and optical properties of (Ag,Cu)(In,Ga)Se2 polycrystalline thin film alloys
J. H. Boyle;
J. H. Boyle
1Institute of Energy Conversion,
University of Delaware, 451 Wyoming Road
, Newark, Delaware 19716, USA
2Department of Materials Science and Engineering,
University of Delaware, 201 DuPont Hall
, Newark, Delaware 19716, USA
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B. E. McCandless;
B. E. McCandless
1Institute of Energy Conversion,
University of Delaware, 451 Wyoming Road
, Newark, Delaware 19716, USA
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W. N. Shafarman;
W. N. Shafarman
1Institute of Energy Conversion,
University of Delaware, 451 Wyoming Road
, Newark, Delaware 19716, USA
2Department of Materials Science and Engineering,
University of Delaware, 201 DuPont Hall
, Newark, Delaware 19716, USA
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R. W. Birkmire
R. W. Birkmire
1Institute of Energy Conversion,
University of Delaware, 451 Wyoming Road
, Newark, Delaware 19716, USA
2Department of Materials Science and Engineering,
University of Delaware, 201 DuPont Hall
, Newark, Delaware 19716, USA
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J. Appl. Phys. 115, 223504 (2014)
Article history
Received:
February 06 2014
Accepted:
May 16 2014
Citation
J. H. Boyle, B. E. McCandless, W. N. Shafarman, R. W. Birkmire; Structural and optical properties of (Ag,Cu)(In,Ga)Se2 polycrystalline thin film alloys. J. Appl. Phys. 14 June 2014; 115 (22): 223504. https://doi.org/10.1063/1.4880243
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