A (001) textured FePt film was deposited on MoC/CrRu/glass at a substrate temperature of 380 °C by using magnetron sputtering. The MoC conductive intermediate layer was used to resist the Cr diffusion up to high deposition temperatures and promotes the epitaxial growth of the (001) textured FePt film. The FePt film showed high perpendicular magnetization and the out-of-plane coercivity increased with MoC thickness. The FePt/MoC (5 nm)/CrRu film showed a square out-of-plane magnetic hysteresis loop with a coercivity of 6.0 kOe and a linear-like in-plane loop. A multi-functional MoC intermediate layer exhibited heteroepitaxial relation with FePt and CrRu and was capable of resisting the interlayer diffusion at high deposition temperatures.
REFERENCES
1.
D.
Weller
et al., IEEE. Trans. Magn.
36
, 10
(2000
).2.
M. H.
Hong
et al., J. Appl. Phys.
84
, 4403
(1998
).3.
S. N.
Piramanayagam
, J. Appl. Phys.
102
, 011301
(2007
).4.
H. J.
Richter
, J. Phys. D: Appl. Phys.
40
, R149
(2007
).5.
T.
Suzuki
et al., IEEE. Trans. Magn.
41
, 555
(2005
).6.
T.
Shima
et al., Appl. Phys. Lett.
88
, 063117
(2006
).7.
J. P.
Liu
et al., Appl. Phys. Lett.
72
, 483
(1998
).8.
J. L.
Tsai
et al., Appl. Phys. Lett.
96
, 032505
(2010
).9.
Y. F.
Ding
et al., Appl. Phys. Lett.
93
, 032506
(2008
).10.
J. S.
Chen
et al., J. Appl. Phys.
105
, 07B702
(2009
).11.
K. F.
Dong
et al., J. Appl. Phys.
111
, 07A308
(2012
).12.
J. L.
Tsai
et al., J. Appl. Phys.
111
, 07A709
(2012
).13.
L.
Zhang
et al., J. Magn. Magn. Mater.
322
, 2658
(2010
).14.
O.
Mosendz
et al., J. Appl. Phys.
111
, 07B729
(2012
).15.
S. D.
Granz
et al., J. Appl. Phys.
111
, 07B709
(2012
).16.
E.
Yang
et al., J. Appl. Phys.
111
, 07B720
(2012
).17.
J. L.
Tsai
et al., J. Alloys Compd.
579
, 12
(2013
).18.
J. S.
Chen
et al., Appl. Phys. Lett.
81
, 1848
(2002
).19.
J. S.
Chen
et al., Appl. Phys. Lett.
90
, 042508
(2007
).20.
C. C.
Tripathi
et al., Appl. Surf. Sci.
255
, 3518
(2009
).21.
H. W.
Hugosson
et al., Chem. Phys. Lett.
333
, 444
(2001
).22.
Y. C.
Feng
et al., J. Appl. Phys.
76
, 7311
(1994
).23.
S. D.
Granz
and M. H.
Kryder
, J. Magn. Magn. Mater.
324
, 287
(2012
).24.
E.
Yang
et al., IEEE. Trans. Magn.
48
, 7
(2012
).25.
See supplementary material at http://dx.doi.org/10.1063/1.4863376 for Figure S1 shows the XRD diffraction patterns of FePt(380 °C)/ MoC(t)/CrRu (200 °C), t = (a) 5 nm deposited at 380 °C, (b) 7 nm deposited at 380 °C, and (c) 20 nm, deposited at 200 °C and Figure S2 shows the elements mapping of FePt/MoC(5 nm)/CrRu film using EDX attached on TEM.
© 2014 AIP Publishing LLC.
2014
AIP Publishing LLC
You do not currently have access to this content.
