Plastic relaxation and coherency limit in realistic uncapped InAs/GaAs(001) pyramid and dome nanoislands are investigated in depth. Due to geometrical symmetry determined by {1 3 7} facets, typical 60° straight dislocations, along [−1 1 0] and [−1 −1 0], are considered separately. We adopt both P-K approach and full finite element method (FEM) model to predict the equilibrium position of misfit dislocation in pure InAs nanoislands. Consistent results are obtained: the positions of two dislocations for maximum strain relaxation are different in pyramid while the positions are same in dome. Based on the full FEM model, the critical dimensions of coherency are evaluated by comparing total energy stored in coherent and dislocated nanoislands. The results indicate that misfit dislocation along [−1 1 0] should generate first in pyramid, while almost identical critical volumes of dome shapes can be expected for both dislocation configurations. Moreover, the critical volume of dome nanoisland rises as the aspect ratio increases.
Skip Nav Destination
Article navigation
7 September 2013
Research Article|
September 03 2013
Plastic relaxation and coherency limit in uncapped multi-faceted InAs/GaAs(001) nanoislands Available to Purchase
Han Ye;
Han Ye
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Search for other works by this author on:
Zhongyuan Yu;
Zhongyuan Yu
a)
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Search for other works by this author on:
Pengfei Lu;
Pengfei Lu
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Search for other works by this author on:
Yumin Liu;
Yumin Liu
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Search for other works by this author on:
Lihong Han
Lihong Han
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Search for other works by this author on:
Han Ye
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Zhongyuan Yu
a)
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Pengfei Lu
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Yumin Liu
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
Lihong Han
State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications
, Beijing 100876, People's Republic of China
a)
Author to whom correspondence should be addressed. Electronic mail: [email protected]
J. Appl. Phys. 114, 093504 (2013)
Article history
Received:
April 03 2013
Accepted:
August 16 2013
Citation
Han Ye, Zhongyuan Yu, Pengfei Lu, Yumin Liu, Lihong Han; Plastic relaxation and coherency limit in uncapped multi-faceted InAs/GaAs(001) nanoislands. J. Appl. Phys. 7 September 2013; 114 (9): 093504. https://doi.org/10.1063/1.4819905
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Re-examination of important defect complexes in silicon: From microelectronics to quantum computing
P. P. Filippatos, A. Chroneos, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.
Piezoelectric thin films and their applications in MEMS: A review
Jinpeng Liu, Hua Tan, et al.
Related Content
Electronic structures of GeSi nanoislands grown on pit-patterned Si(001) substrate
AIP Advances (November 2014)
Strain analysis of Ge/Si(001) islands after initial Si capping by Raman spectroscopy
J. Appl. Phys. (April 2007)
Self-clustering phenomenon of epitaxial FeSi nanoislands on Si(001)
J. Appl. Phys. (July 2010)
Localized Si enrichment in coherent self-assembled Ge islands grown by molecular beam epitaxy on (001)Si single crystal
J. Appl. Phys. (January 2013)
Formation and morphology of InGaN nanoislands on GaN(0001)
J. Vac. Sci. Technol. B (April 2007)