We present a systematic study of the temperature dependence of the electrical noise in a quantum dot, optically gated, field-effect transistor (QDOGFET) and detail how the noise influences the sensitivity of these novel single-photon detectors. Previous studies have shown that when cooled to 4 K, QDOGFETs exhibit single-photon sensitivity and photon-number-resolving capabilities; however, there has been no systematic study of how operating temperature affects their performance. Here, we measure the noise spectra of a device for a range of sample temperatures between 7 K and 60 K. We use the noise data to determine the signal-to-noise ratio of the optical responses of the devices for various temperatures and detection rates. Our analysis indicates that QDOGFETs can operate over a broad range of temperatures, where increased operating temperature can be traded for decreased sensitivity.
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7 September 2013
Research Article|
September 06 2013
Temperature dependence of the single-photon sensitivity of a quantum dot, optically gated, field-effect transistor Available to Purchase
E. J. Gansen;
E. J. Gansen
1
Physics Department, University of Wisconsin – La Crosse
, La Crosse, Wisconsin 54601, USA
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M. A. Rowe;
M. A. Rowe
2
Quantum Electronics and Photonics Division, National Institute of Standards and Technology
, Boulder, Colorado 80305, USA
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S. D. Harrington;
S. D. Harrington
1
Physics Department, University of Wisconsin – La Crosse
, La Crosse, Wisconsin 54601, USA
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J. M. Nehls;
J. M. Nehls
1
Physics Department, University of Wisconsin – La Crosse
, La Crosse, Wisconsin 54601, USA
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S. M. Etzel;
S. M. Etzel
2
Quantum Electronics and Photonics Division, National Institute of Standards and Technology
, Boulder, Colorado 80305, USA
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S. W. Nam;
S. W. Nam
2
Quantum Electronics and Photonics Division, National Institute of Standards and Technology
, Boulder, Colorado 80305, USA
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R. P. Mirin
R. P. Mirin
2
Quantum Electronics and Photonics Division, National Institute of Standards and Technology
, Boulder, Colorado 80305, USA
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E. J. Gansen
1
M. A. Rowe
2
S. D. Harrington
1
J. M. Nehls
1
S. M. Etzel
2
S. W. Nam
2
R. P. Mirin
2
1
Physics Department, University of Wisconsin – La Crosse
, La Crosse, Wisconsin 54601, USA
2
Quantum Electronics and Photonics Division, National Institute of Standards and Technology
, Boulder, Colorado 80305, USA
J. Appl. Phys. 114, 093103 (2013)
Article history
Received:
April 08 2013
Accepted:
August 20 2013
Citation
E. J. Gansen, M. A. Rowe, S. D. Harrington, J. M. Nehls, S. M. Etzel, S. W. Nam, R. P. Mirin; Temperature dependence of the single-photon sensitivity of a quantum dot, optically gated, field-effect transistor. J. Appl. Phys. 7 September 2013; 114 (9): 093103. https://doi.org/10.1063/1.4820474
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