We present a comprehensive investigation into disorder-mediated charge transport in InP nanowires in the statistical doping regime. At zero gate voltage, transport is well described by the space charge limited current model and hopping transport, but positive gate voltage (electron accumulation) reveals a previously unexplored regime of nanowire charge transport that is not well described by existing theory. The ability to continuously tune between these regimes provides guidance for the extension of existing models and directly informs the design of next-generation nanoscale electronic devices.

1.
J.
Appenzeller
,
J.
Knoch
,
M. T.
Bjork
,
H.
Riel
,
H.
Schmid
, and
W.
Riess
,
IEEE Trans. Electron Devices
55
(
11
),
2827
2845
(
2008
).
2.
W.
Lu
and
C. M.
Lieber
,
Nature Mater
6
(
11
),
841
850
(
2007
).
3.
C.
Thelander
,
H. A.
Nilsson
,
L. E.
Jensen
, and
L.
Samuelson
,
Nano Lett.
5
(
4
),
635
638
(
2005
).
4.
X.
Duan
,
Y.
Huang
,
Y.
Cui
,
J.
Wang
, and
C. M.
Lieber
,
Nature
409
(
6816
),
66
69
(
2001
).
5.
E.
Lind
,
A. I.
Persson
,
L.
Samuelson
, and
L.-E.
Wernersson
,
Nano Lett.
6
(
9
),
1842
1846
(
2006
).
6.
S. N.
Cha
,
J. E.
Jang
,
Y.
Choi
,
G. A. J.
Amaratunga
,
G. W.
Ho
,
M. E.
Welland
,
D. G.
Hasko
,
D. J.
Kang
, and
J. M.
Kim
,
Appl. Phys. Lett.
89
(
26
),
263102
263103
(
2006
).
7.
T.
Bryllert
,
L. E.
Wernersson
,
L. E.
Froberg
, and
L.
Samuelson
,
IEEE Electron Device Lett.
27
(
5
),
323
325
(
2006
).
8.
S.
Markov
,
S.
Roy
, and
A.
Asenov
,
IEEE Trans. Electron Devices
57
(
11
),
3106
3114
(
2010
).
9.
S.
Zhang
,
E. R.
Hemesath
,
D. E.
Perea
,
E.
Wijaya
,
J. L.
Lensch-Falk
, and
L. J.
Lauhon
,
Nano Lett.
9
(
9
),
3268
3274
(
2009
).
10.
G.
Micocci
,
A.
Serra
, and
A.
Tepore
,
J. Appl. Phys.
82
(
5
),
2365
2369
(
1997
).
11.
D. S.
April
,
M. D.
Forrest
 III
,
J. W.
Robert
, and
A. K.
Brian
,
Nanotechnology
17
(
10
),
2681
(
2006
).
12.
Y.
Gu
and
L. J.
Lauhon
,
Appl. Phys. Lett.
89
(
14
),
143102
143103
(
2006
).
13.
M.
Yong-Jun
,
Z.
Ze
,
Z.
Feng
,
L.
Li
,
J.
Aizi
, and
G.
Changzhi
,
Nanotechnology
16
(
6
),
746
(
2005
).
14.
M. M.
Fogler
,
S.
Teber
, and
B. I.
Shklovskii
,
Phys. Rev. B
69
(
3
),
035413
(
2004
).
15.
P.
Mark
and
W.
Helfrich
,
J. Appl. Phys.
33
(
1
),
205
215
(
1962
).
16.
M.
Pollak
and
B. I.
Shklovskii
,
Hopping Transport in Solids
(
North-Holland
,
Amsterdam
,
1991
).
17.
X. W.
Zhao
,
A. J.
Hauser
,
T. R.
Lemberger
, and
F. Y.
Yang
,
Nanotechnology
18
(
48
),
485608
(
2007
).
18.
L.
Fang
,
X.
Zhao
,
Y.-H.
Chiu
,
D.
Ko
,
K. M.
Reddy
,
T. R.
Lemberger
,
N. P.
Padture
,
F.
Yang
, and
E.
Johnston-Halperin
,
Appl. Phys. Lett.
99
(
14
),
141101
141103
(
2011
).
19.
S. A.
Dayeh
,
C.
Soci
,
P. K. L.
Yu
,
E. T.
Yu
, and
D.
Wang
,
J. Vac. Sci. Technol. B
25
,
1432
1436
(
2007
).
20.
J.
Maeng
,
T.-W.
Kim
,
G.
Jo
, and
T.
Lee
,
Mater. Res. Bull.
43
(
7
),
1649
1656
(
2008
).
21.
S. M.
Sze
,
Physics of Semiconductor Devices
(
John Wiley & Sons
,
New York
,
1981
).
22.
V.
Kumar
,
S. C.
Jain
,
A. K.
Kapoor
,
J.
Poortmans
, and
R.
Mertens
,
J. Appl. Phys.
94
(
2
),
1283
1285
(
2003
).
23.
G.
Kresse
and
J.
Furthmüller
,
Phys. Rev. B
54
(
16
),
11169
11186
(
1996
);
P. E.
Blochl
,
Phys. Rev. B
50
(
24
),
17953
17979
(
1994
);
G.
Kresse
and
D.
Joubert
,
Phys. Rev. B
59
(
3
),
1758
1775
(
1999
).
24.
J. P.
Perdew
and
Y.
Wang
,
Phys. Rev. B
45
(
23
),
13244
13249
(
1992
).
25.
J.
Heyd
,
G. E.
Scuseria
, and
M.
Ernzerhof
,
J. Chem. Phys.
118
(
18
),
8207
8215
(
2003
);
J.
Heyd
,
G. E.
Scuseria
, and
M.
Ernzerhof
,
J. Chem. Phys.
124
(
21
),
219906
(
2006
);
J.
Paier
,
M.
Marsman
,
K.
Hummer
,
G.
Kresse
,
I. C.
Gerber
, and
J. G.
Angyan
,
J. Chem. Phys.
124
(
15
),
154709
154713
(
2006
).
[PubMed]
26.
W.
Windl
,
M. M.
Bunea
,
R.
Stumpf
,
S. T.
Dunham
, and
M. P.
Masquelier
,
Phys. Rev. Lett.
83
(
21
),
4345
4348
(
1999
).
27.
G.
Hollinger
,
J.
Joseph
,
Y.
Robach
,
E.
Bergignat
,
B.
Commere
,
P.
Viktorovitch
, and
M.
Froment
,
J. Vac. Sci. Technol. B
5
(
4
),
1108
1112
(
1987
).
28.
R.
Mishra
,
O. D.
Restrepo
,
P. M.
Woodward
, and
W.
Windl
,
Chem. Mater.
22
(
22
),
6092
6102
(
2010
).
29.
R.
Mishra
,
O. D.
Restrepo
,
A.
Kumar
, and
W.
Windl
, “
Native point defects in binary InP semiconductors
,”
J. Mater. Sci.
47
,
7482
7497
(
2012
).
30.
A.
Yildiz
,
N.
Serin
,
T.
Serin
, and
M.
Kasap
,
Jpn. J. Appl. Phys., Part 1
48
,
111203
(
2009
).
31.
A. L.
Efros
and
B. I.
Shklovskii
,
J. Phys. C
8
(
4
),
L49
(
1975
).
32.
R.
Rosenbaum
,
Phys. Rev. B
44
(
8
),
3599
3603
(
1991
).
33.
I. S.
Beloborodov
,
A. V.
Lopatin
,
V. M.
Vinokur
, and
K. B.
Efetov
,
Rev. Mod. Phys.
79
(
2
),
469
518
(
2007
).
34.
See supplemental material at http://dx.doi.org/10.1063/1.4813494 for further experimental conditions and quantitative analysis.

Supplementary Material

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