Mechanical stress effect on aging behavior of Bi3.25La0.75Ti3O12 (BLT) and PbZr0.53Ti0.47O3 (PZT) films was investigated. It is found that the remnant polarization decreases with time while the coercive field increases in stress-free BLT films. For unconfined PZT films, both the remnant polarization and the coercive field decrease as time elapses. The applied tensile stress weakens the aging of remnant polarization of BLT films but strengthens the aging of coercive field, while the applied tensile stress possesses opposite effect. In contrary, the applied compressive stress simultaneously improves the aging behavior of both remnant polarization and coercive field of PZT films. Mechanical-stress-induced variation of domain wall mobility in different materials was suggested as the possible origin of these observations. This work indicates that the aging behavior modification using stress could be realized, and it is helpful for promoting the reliability of ferroelectric films for industrial applications.
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14 May 2013
Research Article|
May 08 2013
Mechanical stress modified ferroelectric aging behavior
Tingting Xu;
Tingting Xu
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Yi Kan;
Yi Kan
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Yaming Jin;
Yaming Jin
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Hui Sun;
Hui Sun
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Yingchao Du;
Yingchao Du
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Xiumei Wu;
Xiumei Wu
2
Department of Physics, Southeast University
, Nanjing 211189, People's Republic of China
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Huifeng Bo;
Huifeng Bo
3
College of Science, Hebei United University
, Tangshan 063009, People's Republic of China
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Wei Cai;
Wei Cai
4
School of Physics and Electronic Engineering, Guangzhou University
, Guangzhou 510006, People's Republic of China
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Fengzhen Huang;
Fengzhen Huang
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Xiaomei Lu;
Xiaomei Lu
a)
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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Jinsong Zhu
Jinsong Zhu
1
National Laboratory of Solid State Microstructures and Physics School, Nanjing University
, Nanjing 210093, People's Republic of China
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a)
Electronic mail: xiaomeil@nju.edu.cn
J. Appl. Phys. 113, 187204 (2013)
Article history
Received:
September 29 2012
Accepted:
January 30 2013
Citation
Tingting Xu, Yi Kan, Yaming Jin, Hui Sun, Yingchao Du, Xiumei Wu, Huifeng Bo, Wei Cai, Fengzhen Huang, Xiaomei Lu, Jinsong Zhu; Mechanical stress modified ferroelectric aging behavior. J. Appl. Phys. 14 May 2013; 113 (18): 187204. https://doi.org/10.1063/1.4801978
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