The transmittance and the optical constants of SrF2 thin films, a candidate material for multilayer coatings operating in the extreme ultraviolet and soft x-rays, have been determined in the spectral range of 25–780 eV, in most of which no experimental data were previously available. SrF2 films of various thicknesses were deposited by evaporation onto room-temperature, thin Al support films, and their transmittance was measured with synchrotron radiation. The transmittance as a function of film thickness was used to calculate the extinction coefficient k at each photon energy. A decrease in density with increasing SrF2 film thickness was observed. In the calculation of k, this effect was circumvented by fitting the transmittance versus the product of thickness and density. The real part of the refractive index of SrF2 films was calculated from k with Kramers-Krönig analysis, for which the measured spectral range was extended both to lower and to higher photon energies with data in the literature combined with interpolations and extrapolations. With the application of f- and inertial sum rules, the consistency of the compiled data was found to be excellent.
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14 April 2013
Research Article|
April 08 2013
Optical constants of SrF2 thin films in the 25–780-eV spectral range
Luis Rodríguez-de Marcos;
Luis Rodríguez-de Marcos
1
GOLD-Instituto de Óptica-Consejo Superior de Investigaciones Científicas
, Serrano 144, 28006 Madrid, Spain
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Juan I. Larruquert;
Juan I. Larruquert
a)
1
GOLD-Instituto de Óptica-Consejo Superior de Investigaciones Científicas
, Serrano 144, 28006 Madrid, Spain
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José A. Aznárez;
José A. Aznárez
1
GOLD-Instituto de Óptica-Consejo Superior de Investigaciones Científicas
, Serrano 144, 28006 Madrid, Spain
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Mónica Fernández-Perea;
Mónica Fernández-Perea
2
Lawrence Livermore National Laboratory
, 7000 East Avenue, Livermore, California 94550, USA
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Regina Soufli;
Regina Soufli
2
Lawrence Livermore National Laboratory
, 7000 East Avenue, Livermore, California 94550, USA
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José A. Méndez;
José A. Méndez
1
GOLD-Instituto de Óptica-Consejo Superior de Investigaciones Científicas
, Serrano 144, 28006 Madrid, Spain
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Sherry L. Baker;
Sherry L. Baker
2
Lawrence Livermore National Laboratory
, 7000 East Avenue, Livermore, California 94550, USA
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Eric M. Gullikson
Eric M. Gullikson
3
Lawrence Berkeley National Laboratory
, 1 Cyclotron Road, Berkeley, California 94720, USA
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a)
Author to whom correspondence should be addressed. Electronic mail: [email protected]. Fax: 34 914117651.
J. Appl. Phys. 113, 143501 (2013)
Article history
Received:
February 21 2013
Accepted:
March 21 2013
Citation
Luis Rodríguez-de Marcos, Juan I. Larruquert, José A. Aznárez, Mónica Fernández-Perea, Regina Soufli, José A. Méndez, Sherry L. Baker, Eric M. Gullikson; Optical constants of SrF2 thin films in the 25–780-eV spectral range. J. Appl. Phys. 14 April 2013; 113 (14): 143501. https://doi.org/10.1063/1.4800099
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