A noise characteristics model is presented for short wavelength infrared (SWIR) focal plane arrays (FPAs). The model shows the relationship between noise and varying integration time. The experimental results for different SWIR InGaAs linear FPAs in the 1.0–1.7 μm and 1.0–2.4 μm spectral range can be well fitted by this model. The noise of InGaAs FPAs with the conventional process in the 1.0–1.7 μm spectral range is determined by the shot noise from the photodiode, which provides a direction for reducing the noise of FPAs. The noise of InGaAs FPAs with the improved process in the 1.0–1.7 μm spectral range is determined by the noise from the readout integrated circuit (ROIC), which is due to the lower shot noise from the dark current of the photodiode. The noise of InGaAs FPAs in the 1.0–2.4 μm spectral range shows a transition from the fixed-pattern noise to the shot noise with a decrease of temperature as indicated by the model. This reduction is mainly due to the higher dark current of photodiodes and the non-uniformity of the dark current. It could be expected that the noise characteristics model is appropriate for the other infrared FPAs. Further, gain constants and conversion efficiencies of the ROIC are obtained according to a signal to noise relationship of the FPAs.
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15 September 2012
Research Article|
September 24 2012
Noise characteristics of short wavelength infrared InGaAs linear focal plane arrays
Xue Li;
Xue Li
a)
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Songlei Huang;
Songlei Huang
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Yu Chen;
Yu Chen
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Hengjing Tang;
Hengjing Tang
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Xiumei Shao;
Xiumei Shao
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Tao Li;
Tao Li
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Haimei Gong;
Haimei Gong
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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Jiaxiong Fang
Jiaxiong Fang
State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China and Key Laboratory of Infrared Imaging Materials and Detectors,
Shanghai Institute of Technical Physics
, Chinese Academy of Sciences, Shanghai 200083, People's Republic of China
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a)
Author to whom correspondence should be addressed. Electronic mail: [email protected]. Tel.: +86-21-25051448. Fax: +86-21-65171130.
J. Appl. Phys. 112, 064509 (2012)
Article history
Received:
May 01 2012
Accepted:
August 24 2012
Citation
Xue Li, Songlei Huang, Yu Chen, Hengjing Tang, Xiumei Shao, Tao Li, Haimei Gong, Jiaxiong Fang; Noise characteristics of short wavelength infrared InGaAs linear focal plane arrays. J. Appl. Phys. 15 September 2012; 112 (6): 064509. https://doi.org/10.1063/1.4754579
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