The effects of compressive stress on the TO phonon frequencies of hexagonal boron nitride (hBN) in cubic BN (cBN) films were investigated using infrared absorption spectroscopy, showing that the B–N stretching vibration of hBN at 1380 cm−1 shifted to high wavenumbers under biaxial compressive stress with the rate 2.65 cm−1 per GPa, while the B–N–B bending vibration near 780 cm−1 shifted to low wavenumbers with the rate −3.45 cm−1/GPa. The density functional perturbation theoretical calculation was carried out to check the above phonon frequencies under stress for two typical orientations of hBN crystallite. The results are shown to be in fair agreement with the experimental data. Our results suggest that the residual compressive stress accumulated in cBN films can be evaluated from the IR peak position near 780 cm−1.
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1 September 2012
Research Article|
September 05 2012
Residual compressive stress induced infrared-absorption frequency shift of hexagonal boron nitride in cubic boron nitride films prepared by plasma-enhanced chemical vapor deposition
Yong Liu;
Yong Liu
1State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering,
Zhejiang University
, Zheda Road 38, Hangzhou 310027, China
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Panpan Jin;
Panpan Jin
1State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering,
Zhejiang University
, Zheda Road 38, Hangzhou 310027, China
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Aili Chen;
Aili Chen
1State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering,
Zhejiang University
, Zheda Road 38, Hangzhou 310027, China
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Hangsheng Yang;
Hangsheng Yang
a)
1State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering,
Zhejiang University
, Zheda Road 38, Hangzhou 310027, China
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Yabo Xu
Yabo Xu
2Department of Physics,
Zhejiang University
, Zheda Road 38, Hangzhou 310027, China
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a)
Author to whom correspondence should be addressed. Electronic mail: hsyang@zju.edu.cn.
J. Appl. Phys. 112, 053502 (2012)
Article history
Received:
May 17 2012
Accepted:
August 09 2012
Citation
Yong Liu, Panpan Jin, Aili Chen, Hangsheng Yang, Yabo Xu; Residual compressive stress induced infrared-absorption frequency shift of hexagonal boron nitride in cubic boron nitride films prepared by plasma-enhanced chemical vapor deposition. J. Appl. Phys. 1 September 2012; 112 (5): 053502. https://doi.org/10.1063/1.4749805
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