Epitaxial (1−x)BaTiO3xBi(Mg0.5Ti0.5)O3 films with x = 0 − 0.9 were grown on (111)cSrRuO3//(111)SrTiO3 substrates by pulsed laser deposition (PLD). Plotting the temperature where dielectric constant reaches a maximum {T[ɛr(max.)]} versus Bi(Mg0.5,Ti0.5)O3 content present minimum at x = 0.1. On the other hand, the remanent polarization (Pr) and the effective transverse piezoelectric constant [d33(eff.)] showed minimum at 0.1 and 0.2, respectively, but increased with the increase of x in (1−x)BaTiO3xBi(Mg0.5Ti0.5)O3 above these values. These results show the simultaneous increase of T[ɛr(max.)] and d33(eff.) for the films above x = 0.2 that normally showed treads off characteristics.

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