Laser-induced crystalline-amorphous phase change of Ge-Sb-Te alloys is the key mechanism enabling the fast and stable writing/erasing processes in rewritable optical storage devices, such as digital versatile disk (DVD) or blu-ray disk. Although the structural information in the amorphous phase is essential for clarifying this fast process, as well as long lasting stabilities of both the phases, experimental works were mostly limited to the short-range order by x ray absorption fine structure. Here we show both the short and intermediate-range atomic structures of amorphous DVD material, Ge2Sb2Te5 (GST), investigated by a combination of anomalous x ray scattering and reverse Monte Carlo modeling. From the obtained atomic configurations of amorphous GST, we have found that the Sb atoms and half of the Ge atoms play roles in the fast phase change process of order-disorder transition, while the remaining Ge atoms act for the proper activation energy of barriers between the amorphous and crystalline phases.
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15 April 2012
Research Article|
April 19 2012
Key experimental information on intermediate-range atomic structures in amorphous Ge2Sb2Te5 phase change material
Shinya Hosokawa;
Shinya Hosokawa
a)
1Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities,
Hiroshima Institute of Technology
, Hiroshima 731-5193, Japan
2Fachbereich Chemie, Physikalische Chemie,
Philipps-Universität Marburg
, Marburg 35032, Germany
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Wolf-Christian Pilgrim;
Wolf-Christian Pilgrim
2Fachbereich Chemie, Physikalische Chemie,
Philipps-Universität Marburg
, Marburg 35032, Germany
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Astrid Höhle;
Astrid Höhle
2Fachbereich Chemie, Physikalische Chemie,
Philipps-Universität Marburg
, Marburg 35032, Germany
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Daniel Szubrin;
Daniel Szubrin
2Fachbereich Chemie, Physikalische Chemie,
Philipps-Universität Marburg
, Marburg 35032, Germany
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Nathalie Boudet;
Nathalie Boudet
3Institut Néel,
Centre National de la Recherche Scientifique/Université Joseph Fourier (CNRS/UJF)
, Grenoble cedex 9 38042, France
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Jean-François Bérar;
Jean-François Bérar
3Institut Néel,
Centre National de la Recherche Scientifique/Université Joseph Fourier (CNRS/UJF)
, Grenoble cedex 9 38042, France
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Kenji Maruyama
Kenji Maruyama
4Department of Chemistry, Faculty of Science,
Niigata University
, Niigata 950-2181, Japan
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Shinya Hosokawa
1,2,a)
Wolf-Christian Pilgrim
2
Astrid Höhle
2
Daniel Szubrin
2
Nathalie Boudet
3
Jean-François Bérar
3
Kenji Maruyama
4
1Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities,
Hiroshima Institute of Technology
, Hiroshima 731-5193, Japan
2Fachbereich Chemie, Physikalische Chemie,
Philipps-Universität Marburg
, Marburg 35032, Germany
3Institut Néel,
Centre National de la Recherche Scientifique/Université Joseph Fourier (CNRS/UJF)
, Grenoble cedex 9 38042, France
4Department of Chemistry, Faculty of Science,
Niigata University
, Niigata 950-2181, Japan
a)
Author to whom correspondence should be addressed. Present address: Department of Physics, Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-0970, Japan. Electronic mail: [email protected].
J. Appl. Phys. 111, 083517 (2012)
Article history
Received:
December 13 2011
Accepted:
March 13 2012
Citation
Shinya Hosokawa, Wolf-Christian Pilgrim, Astrid Höhle, Daniel Szubrin, Nathalie Boudet, Jean-François Bérar, Kenji Maruyama; Key experimental information on intermediate-range atomic structures in amorphous Ge2Sb2Te5 phase change material. J. Appl. Phys. 15 April 2012; 111 (8): 083517. https://doi.org/10.1063/1.3703570
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