Large-scale, high-rate epitaxial growth technology for the second-generation superconducting wire brings unique technological challenges for the thin-film coating industry. One of the most difficult steps of the process is controlling nucleation of a complex compound over a km-long low-cost oxide template. Here, we analyze early stages of industrial-scale epitaxial metal organic chemical vapor deposition (MOCVD) growth of ReBa2Cu3Ox (REBCO, Re = rare-earth) on buffered metal substrates. The nucleation event is detected by high-flux synchrotron X-ray diffraction and confirmed by atomic force microscopy. REBCO nuclei exhibit a strong preference for edges of the buffer grain, indicating that (001) steps of the buffer grains are preferred nucleation sites. It is concluded that random nucleation of REBCO is caused by agglomerates of small buffer grains.
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