Using a combination of semiconductor theory and experimental results from the scientific literature, we have compiled and plotted the key third-order nonlinear optical coefficients of bulk crystalline Si and Ge as a function of wavelength (1.5−6.7 μm for Si and 2–14.7 μm for Ge). The real part of third-order nonlinear dielectric susceptibility (χ(3)′), the two-photon absorption coefficient (βTPA), and the Raman gain coefficient (gR), have been investigated. Theoretical predictions were used to curve-fit the experimental data. For a spectral range in which no experimental data exists, we estimate and fill in the missing knowledge. Generally, these coefficient-values appear quite useful for a host of device applications, both Si and Ge offer large χ(3)′ and gR with Ge offering the stronger nonlinearity. In addition, we use the same theory to predict the third-order nonlinear optical coefficients of Si1−xGex alloy. By alloying Si and Ge, device designers can gain flexibility in tuning desired optical coefficients in between the two fundamental components based upon their application requirements.
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1 July 2011
Review Article|
July 14 2011
The third-order nonlinear optical coefficients of Si, Ge, and Si1−xGex in the midwave and longwave infrared
Nick K. Hon;
Nick K. Hon
a)
1Photonics Laboratory, Electrical Engineering Department,
University of California
, Los Angeles, California 90095, USA
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Richard Soref;
Richard Soref
2Sensors Directorate, Air Force Research Laboratory, AFRL/RYHC, Hanscom Air Force Base, Massachusetts 01731-2909,
USA
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Bahram Jalali
Bahram Jalali
1Photonics Laboratory, Electrical Engineering Department,
University of California
, Los Angeles, California 90095, USA
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a)
Author to whom correspondence should be addressed. Electronic mail: [email protected].
J. Appl. Phys. 110, 011301 (2011)
Article history
Received:
September 21 2010
Accepted:
March 25 2011
Citation
Nick K. Hon, Richard Soref, Bahram Jalali; The third-order nonlinear optical coefficients of Si, Ge, and Si1−xGex in the midwave and longwave infrared. J. Appl. Phys. 1 July 2011; 110 (1): 011301. https://doi.org/10.1063/1.3592270
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