We studied ferroelectric properties of morphotropic phase boundary (1−x)BiScO3−(x)PbTiO3 (BSPT, x = 0.64) epitaxial thin films on SrTiO3 (001) and Nb:SrTiO3 (001). BSPT thin films with various thicknesses were deposited using off-axis radio frequency magnetron sputtering. By analyzing x-ray data of BSPT thin films with various thicknesses, we confirmed that films thinner than ∼22 nm were in a strained state. Films thicker than ∼22 nm were in a relaxed state because of the strain relaxation mechanism caused by misfit dislocation formation. Clear piezoresponses and polarization reversal phenomena can be observed in the ultrathin limit down to 8 nm through Piezo Force Microscope experiments. The piezoresponse data as a function of thickness correlates with the structural modification of thin films.
Skip Nav Destination
Article navigation
15 March 2011
Research Article|
March 25 2011
Epitaxial growth and piezoelectric characterization of the (1−x)BiScO3−(x)PbTiO3 ultrathin film
Youngsoo Wu;
Youngsoo Wu
Department of Physics,
Pusan National University
, Busan 609-735, Korea
Search for other works by this author on:
Yeryeong Jin;
Yeryeong Jin
Department of Physics,
Pusan National University
, Busan 609-735, Korea
Search for other works by this author on:
Bongju Kim;
Bongju Kim
Department of Physics,
Pusan National University
, Busan 609-735, Korea
Search for other works by this author on:
Daeyoung Kwon;
Daeyoung Kwon
Department of Physics,
Pusan National University
, Busan 609-735, Korea
Search for other works by this author on:
Bog G. Kim
Bog G. Kim
a)
Department of Physics,
Pusan National University
, Busan 609-735, Korea
Search for other works by this author on:
a)
Author to whom correspondence should be addressed. Electronic address: [email protected].
J. Appl. Phys. 109, 064109 (2011)
Article history
Received:
October 04 2010
Accepted:
February 19 2011
Citation
Youngsoo Wu, Yeryeong Jin, Bongju Kim, Daeyoung Kwon, Bog G. Kim; Epitaxial growth and piezoelectric characterization of the (1−x)BiScO3−(x)PbTiO3 ultrathin film. J. Appl. Phys. 15 March 2011; 109 (6): 064109. https://doi.org/10.1063/1.3567297
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Efficient methods for extracting superconducting resonator loss in the single-photon regime
Cliff Chen, David Perello, et al.
Tutorial: Simulating modern magnetic material systems in mumax3
Jonas J. Joos, Pedram Bassirian, et al.