We implemented an experimental scheme for ultrafast x-ray diffraction at storage rings based on a laser-driven Bragg-switch that shortens the x-ray pulses emitted from an undulator. The increased time-resolution is demonstrated by observing changes of intensity, position and width of the diffraction peaks of a / superlattice sample after optical excitation, i.e., by quantitatively measuring the propagation of an expansion wave through the sample. These experimental transients with timescales of 35 to 60 ps evidence a reduction of the x-ray pulse duration by a factor of two.
REFERENCES
1.
R.
Schoenlein
, S.
Chattopadhyay
, H.
Chong
, T.
Glover
, P.
Heimann
, C.
Shank
, A.
Zholents
, and M.
Zolotorev
, Science
287
, 2237
(2000
). 2.
S.
Khan
, K.
Holldack
, T.
Kachel
, R.
Mitzner
, and T.
Quast
, Phys. Rev. Lett.
97
, 074801
(2006
). 3.
P.
Beaud
, S.
Johnson
, A.
Streun
, R.
Abela
, D.
Abramsohn
, D.
Grolimund
, F.
Krasniqi
, T.
Schmidt
, V.
Schlott
, and G.
Ingold
, Phys. Rev. Lett.
99
, 174801
(2007
). 4.
B.
McNeil
, Nat. Photonics
3
, 375
(2009
). 5.
M.
Abo-Bakr
, J.
Feikes
, K.
Holldack
, P.
Kuske
, W. B.
Peatman
, U.
Schade
, G.
Wüstefeld
, and H.-W.
Hübers
, Phys. Rev. Lett.
90
, 094801
(2003
). 6.
I.
Radu
, C.
Stamm
, N.
Pontius
, T.
Kachel
, P.
Ramm
, J.-U.
Thiele
, H. A.
Dürr
, and C. H.
Back
, Phys. Rev. B
81
, 104415
(2010
). 7.
F.
Zamponi
, Z.
Ansari
, C.
von Korff Schmising
, P.
Rothhardt
, N.
Zhavoronkov
, M.
Woerner
, T.
Elsaesser
, M.
Bargheer
, T.
Trobitzsch-Ryll
, and M.
Haschke
, Appl. Phys. A
96
, 51
(2009
). 8.
J.
Larsson
, P.
Heimann
, A.
Lindenberg
, P.
Schuck
, P.
Bucksbaum
, R.
Lee
, H.
Padmore
, J.
Wark
, and R.
Falcone
, App. Phys. A
66
, 587
(1998
). 9.
M.
Herzog
, W.
Leitenberger
, R.
Shayduk
, R. M.
van der Veen
, C. J.
Milne
, S. L.
Johnson
, I.
Vrejoiu
, M.
Alexe
, D.
Hesse
, and M.
Bargheer
, Appl. Phys. Lett.
96
, 161906
(2010
). 10.
M.
Wulff
, A.
Plech
, L.
Eybert
, R.
Randler
, F.
Schotte
, and P.
Anfinrud
, Faraday Discuss.
122
, 13
(2003
). 11.
I.
Vrejoiu
, G.
Le Rhun
, L.
Pintilie
, D.
Hesse
, M.
Alexe
, and U.
Gösele
, Adv. Mater.
18
, 1657
(2006
). 12.
Here we adopt the notation of SL peak orders described in, e.g.,
G.
Bauer
and W.
Richter
, Optical Characterization of Epitaxial Semiconductor Layers
(Springer
, Berlin
, 1996
). The SRO/STO (002) ZOP corresponds to the (0 0 116) SL reflection of previous publications.13.
C. v.
Korff Schmising
, M.
Bargheer
, M.
Kiel
, N.
Zhavoronkov
, M.
Woerner
, T.
Elsaesser
, I.
Vrejoiu
, D.
Hesse
, and M.
Alexe
, Phys. Rev. Lett.
98
, 257601
(2007
). 14.
S.
Yamanaka
, T.
Maekawa
, H.
Muta
, T.
Matsuda
, S.
Kobayashi
, and K.
Kurosaki
, J. Solid State Chem.
177
, 3484
(2004
). 15.
Y. H.
Ren
, M.
Trigo
, R.
Merlin
, V.
Adyam
, and Q.
Li
, Appl. Phys. Lett.
90
, 251918
(2007
). © 2011 American Institute of Physics.
2011
American Institute of Physics
You do not currently have access to this content.