We present a model of charge transport in polycrystalline electronic films, which considers details of the microscopic scale while simultaneously allowing realistically sized films to be simulated. We discuss the approximations and assumptions made by the model, and rationalize its application to thin films of directionally crystallized poly(3-hexylthiophene). In conjunction with experimental data, we use the model to characterize the effects of defects in these films. Our findings support the hypothesis that it is the directional crystallization of these films, rather than their defects, which causes anisotropic mobilities.
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See supplementary materials at http://dx.doi.org/10.1063/1.3594686 for a discussion of the discretization constant, and its effect on the temperature dependence of the mobility. Also given is an analytical expression for the decay of mobility with increasing intra-fiber break density.
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2011
American Institute of Physics
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