We elucidated the relationship between the dielectric tunability and the electro-optic (EO) effect. A new measurement system for EO effect and dielectric permittivity (εr) was developed to investigate the accurate correlation between EO and dielectric properties of epitaxial barium strontium titanate, Ba0.5Sr0.5TiO3 (BST) thin films grown on SrTiO3 (STO) substrates. The BST films had a strained lattice with a large lattice parameter along the thickness direction. Small birefringence was induced in the as-deposited film by the alignment of the c-axis in the film plane. The tunability of dielectric permittivity calculated from the complex voltage and current with planer electrodes reached to 53.1%, and the tunability of birefringence by EO effect was 0.6%. The birefringence change from EO effect was much lower than the tunability of dielectric permittivity. Therefore, there is no strong correlation between the dielectric tunability and EO effect, and the materials with high tunability do not always exhibit high EO effect. Finally, we discussed how to obtain the materials with high EO effect considering these results.

1.
D. W.
Dolfi
,
M.
Nazarathy
, and
R. L.
Jungerman
,
Electron. Lett.
24
,
528
(
1988
).
2.
J. D.
Zook
,
D.
Chen
, and
G. N.
Otto
,
Appl. Phys. Lett.
11
,
159
(
1967
).
3.
A. F.
El-Sherif
and
T. A.
King
,
Opt. Commun.
218
,
337
(
2003
).
4.
S.
Triebwasser
,
Phys. Rev.
114
,
63
(
1959
).
5.
F. S.
Chen
,
J. E.
Geusic
,
S. K.
Kurtz
,
J. G.
Skinner
, and
S. H.
Wemple
,
J. Appl. Phys.
37
,
388
(
1966
).
6.
T.
Fujii
,
T.
Suzuki
,
Y.
Fujimori
,
T.
Nakamura
,
M.
Moriwake
, and
H.
Takasu
,
Jpn. J. Appl. Phys., Part 1
45
,
7520
(
2006
).
7.
M.
Gaidi
,
A.
Amassian
,
M.
Chaker
,
M.
Kulishov
, and
L.
Martinu
,
Appl. Surf. Sci.
226
,
347
(
2004
).
8.
H.
Adachi
,
T.
Mitsuyu
,
O.
Yamazaki
, and
K.
Wasa
,
J. Appl. Phys.
60
,
736
(
1986
).
9.
A.
Tombak
,
J. -P.
Maria
,
F.
Ayguavives
,
Z.
Jin
,
G. T.
Stauf
,
A. I.
Kingon
, and
A.
Mortazawi
,
IEEE Microw. Wirel. Compon. Lett.
12
,
3
(
2002
).
10.
E. G.
Erker
,
A. S.
Nagra
,
Y.
Liu
,
P.
Periaswamy
,
T. R.
Taylor
,
J.
Speck
, and
R. A.
York
,
IEEE Microw. Wirel. Compon. Lett.
10
,
10
(
2000
).
11.
A.
Tombak
,
J. -P.
Maria
,
F.
Ayguavives
,
Z.
Jin
,
G. T.
Stauf
,
A. I.
Kingon
, and
A.
Mortazawi
,
IEEE Trans. Microwave Theory Tech.
51
,
462
(
2003
).
12.
J.
Im
,
O.
Auciello
,
P. K.
Baumann
,
S. K.
Streiffer
,
D. Y.
Kaufman
, and
A. R.
Krauss
,
Appl. Phys. Lett.
76
,
625
(
2000
).
13.
J.
Im
,
O.
Auciello
, and
S. K.
Streiffer
,
Thin Solid Films
413
,
243
(
2002
).
14.
H. D.
Wu
,
Z.
Zhang
,
F.
Barnes
,
M.
Jackson
,
A.
Kain
, and
J. D.
Cuchiaro
,
IEEE Trans. Appl. Supercond.
4
,
156
(
1994
).
15.
B.
Su
,
J. E.
Holmes
,
C.
Meggs
, and
T. W.
Button
,
J. Eur. Ceram. Soc.
23
,
2699
(
2003
).
16.
J.
Li
,
F.
Duewer
,
C.
Gao
,
H.
Chang
, and
X. -D.
Xiang
,
Appl. Phys. Lett.
76
,
769
(
2000
).
17.
D. Y.
Wang
,
C. L.
Mak
,
K. H.
Wong
,
H. L. W.
Chan
, and
C. L.
Choy
,
Ceram. Int.
30
,
1745
(
2004
).
18.
M. J.
McQuarrie
,
J. Am. Chem. Soc.
38
,
444
(
1955
).
19.
Z. -G.
Ye
,
Handbook of Advanced Dielectric, Piezoelectric, and Ferroelectric Materials
, 1st ed. (
CRC
,
New York
,
2008
).
20.
Y.
Lin
,
J. -S.
Lee
,
H.
Wang
,
Y.
Li
,
S. R.
Foltyn
,
Q. X.
Jia
,
G. E.
Collis
,
A. K.
Burrell
, and
T. M.
McCleskey
,
Appl. Phys. Lett.
85
,
5007
(
2004
).
21.
F.
Tcheliebou
,
H. S.
Ryu
,
C. K.
Hong
,
W. S.
Park
, and
S.
Baik
,
Thin Solid Films
305
,
30
(
1997
).
22.
T.
Tsurumi
,
J.
Li
,
T.
Hoshina
,
H.
Kakemoto
,
M.
Nakata
, and
J.
Akedo
,
Appl. Phys. Lett.
91
,
182905
(
2007
).
23.
A. S.
Chen
,
A.
Bhalla
, and
L. E.
Cross
,
Phys. Rev. B
64
,
184104
(
2001
).
24.
K.
Nomura
and
H.
Ogawa
,
J. Appl. Phys.
70
,
3234
(
1991
).
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