Carbon (C)-doping has been found to increase the upper critical field in superconducting thin-film and bulk samples. However, the C effects on both and lattice parameters are very different between thin films and bulk, suggesting C may incorporate differently in the two cases. This paper combines ab initio calculations and thin-film lattice parameter measurements to explore the connection between substitutional and interstitial C in and experimental bulk and thin-film lattice parameters.
REFERENCES
1.
A.
Gurevich
, S.
Patnaik
, V.
Braccini
, K. H.
Kim
, C.
Mielke
, X.
Song
, L. D.
Cooley
, S. D.
Bu
, D. M.
Kim
, J. H.
Choi
, L. J.
Belenky
, J.
Giencke
, M. K.
Lee
, W.
Tian
, X. Q.
Pan
, A.
Siri
, E. E.
Hellstrom
, C. B.
Eom
, and D. C.
Larbalestier
, Supercond. Sci. Technol.
17
, 278
(2004
).2.
J.
Nagamatsu
, N.
Nakagawa
, T.
Muranaka
, Y.
Zenitani
, and J.
Akimitsu
, Nature (London)
410
, 63
(2001
).3.
V.
Braccini
, A.
Gurevich
, J. E.
Giencke
, M. C.
Jewell
, C. B.
Eom
, D. C.
Larbalestier
, A.
Pogrebnyakov
, Y.
Cui
, B. T.
Liu
, Y. F.
Hu
, J. M.
Redwing
, Q.
Li
, X. X.
Xi
, R. K.
Singh
, R.
Gandikota
, J.
Kim
, B.
Wilkens
, N.
Newman
, J.
Rowell
, B.
Moeckly
, V.
Ferrando
, C.
Tarantini
, D.
Marre
, M.
Putti
, C.
Ferdeghini
, R.
Vaglio
, and E.
Haanappel
, Phys. Rev. B
71
, 012504
(2005
).4.
Y.
Zhu
, D. C.
Larbalestier
, P. M.
Voyles
, A. V.
Pogrebnyakov
, X. X.
Xi
, and J. M.
Redwing
, Appl. Phys. Lett.
91
, 082513
(2007
).5.
M. D.
Sumption
, M.
Bhatia
, M.
Rindfleisch
, M.
Tomsic
, S.
Soltanian
, S. X.
Dou
, and E. W.
Collings
, Appl. Phys. Lett.
86
, 102501
(2005
).6.
A. V.
Pogrebnyakov
, X. X.
Xi
, J. M.
Redwing
, V.
Vaithyanathan
, D. G.
Schlom
, A.
Soukiassian
, S. B.
Mi
, C. L.
Jia
, J. E.
Giencke
, C. B.
Eom
, J.
Chen
, Y. F.
Hu
, Y.
Cui
, and Q.
Li
, Appl. Phys. Lett.
85
, 2017
(2004
).7.
S.
Lee
, T.
Masui
, A.
Yamamoto
, H.
Uchiyama
, and S.
Tajima
, Physica C
397
, 7
(2003
);S. M.
Kazakov
, R.
Puzniak
, K.
Rogacki
, A. V.
Mironov
, N. D.
Zhigadlo
, J.
Jun
, C.
Soltmann
, B.
Batlogg
, and J.
Karpinski
, Phys. Rev. B
71
, 024533
(2005
);B. J.
Senkowicz
, J. E.
Giencke
, S.
Patnaik
, C. B.
Eom
, E. E.
Hellstrom
, and D. C.
Larbalestier
, Appl. Phys. Lett.
86
, 202502
(2005
).8.
W. K.
Yeoh
, J.
Horvat
, J. H.
Kim
, X.
Xu
, and S. X.
Dou
, Appl. Phys. Lett.
90
, 122502
(2007
).9.
Y. F.
Yan
and M. M.
Al-Jassim
, J. Appl. Phys.
92
, 7687
(2002
).10.
A.
Saengdeejing
, J. E.
Saal
, Y.
Wang
, and Z. K.
Liu
, Appl. Phys. Lett.
90
, 151920
(2007
).11.
G.
Kresse
and J.
Furthmuller
, Comput. Mater. Sci.
6
, 15
(1996
).12.
G.
Kresse
and D.
Joubert
, Phys. Rev. B
59
, 1758
(1999
);P. E.
Blöchl
, Phys. Rev. B
50
, 17953
(1994
).13.
G.
Kresse
and J.
Hafner
, Phys. Rev. B
47
, 558
(1993
);G.
Kresse
and J.
Furthmuller
, Phys. Rev. B
54
, 11169
(1996
).14.
J. P.
Perdew
, K.
Burke
, and M.
Ernzerhof
, Phys. Rev. Lett.
77
, 3865
(1996
).15.
S. H.
Wei
, L. G.
Ferreira
, J. E.
Bernard
, and A.
Zunger
, Phys. Rev. B
42
, 9622
(1990
).16.
A.
van de Walle
, M.
Asta
, and G.
Ceder
, CALPHAD: Comput. Coupling Phase Diagrams Thermochem.
26
, 539
(2002
).17.
See supplementary material at http://dx.doi.org/10.1063/1.3275867 E-JAPIAU-107-037001 for information on the computational and interstitial sites for all C concentrations.
18.
J. R.
Taylor
, An Introduction to Error Analysis: The Study of Uncertainties in Physical Measurements
, 2nd ed. (University Science Books
, Sausalito
, 1982
).© 2010 American Institute of Physics.
2010
American Institute of Physics
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