The lumped circuit elements representing electrical contact of a single and multiple contact points are constructed. The local electrical contact is assumed to be in the form of a cylindrical constriction (connecting bridge) of radius and axial length , made of the same material as the main conducting current channel of radius . The resistance, capacitance, and the inductance of the electrical contact are given in terms of , , and , from which the rf properties of electrical contact are obtained. For the case of conducting surfaces with a single connecting bridge with dimension in micron size, the resulting resonant frequency is found to be in the terahertz regime. A statistical analysis on a distribution of these dimensions follows. It is found that for multiple contact points, the quality factor and the resonance frequency are roughly independent of , whereas the characteristic impedance is proportional to , where represents the number of contact points. The implications of these findings are discussed.
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15 October 2009
Research Article|
October 22 2009
Lumped circuit elements, statistical analysis, and radio frequency properties of electrical contact
W. Tang;
Department of Nuclear Engineering and Radiological Sciences,
University of Michigan
, Ann Arbor, Michigan 48109-2104, USA
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Y. Y. Lau;
Y. Y. Lau
Department of Nuclear Engineering and Radiological Sciences,
University of Michigan
, Ann Arbor, Michigan 48109-2104, USA
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R. M. Gilgenbach
R. M. Gilgenbach
Department of Nuclear Engineering and Radiological Sciences,
University of Michigan
, Ann Arbor, Michigan 48109-2104, USA
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a)
Electronic mail: [email protected].
J. Appl. Phys. 106, 084904 (2009)
Article history
Received:
July 28 2009
Accepted:
September 14 2009
Citation
W. Tang, Y. Y. Lau, R. M. Gilgenbach; Lumped circuit elements, statistical analysis, and radio frequency properties of electrical contact. J. Appl. Phys. 15 October 2009; 106 (8): 084904. https://doi.org/10.1063/1.3246872
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