The specific features of the Rayleigh wave reflection from single surface imperfections of an isotropic substrate are studied by the finite element method. Six types of the imperfections are considered, namely, upstep and downstep, projection and groove, and strip of foreign material coating the substrate and buried into it. The dependence is found and analyzed of the absolute value and the phase of the reflection coefficients on the geometrical parameters of defects and the angle of incidence. Numerical results are compared to analytical predictions based on a development of the reflection coefficient in powers of the defect height to wavelength ratio and limited to the first-order term. In particular, this comparison reveals that in some cases approximate expressions are able to provide a good precision. At the same time situations are met when the linear approximation fails to describe the behavior of the reflection coefficient even at fairly small .
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1 August 2009
Research Article|
August 11 2009
Rayleigh wave reflection from single surface imperfections on isotropic substrates
A. N. Darinskii;
A. N. Darinskii
a)
1Institute of Crystallography,
Russian Academy of Sciences
, Leninskii pr. 59, Moscow 119333, Russia
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M. Weihnacht;
M. Weihnacht
2
Leibniz Institute for Solid State and Materials Research Dresden
, P.O. Box 27 00 16, D-01171 Dresden, Germany
3
Innovations in Crystal Acoustics
, Am Muehlfeld 34, D-01744 Dippoldiswalde, Germany
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H. Schmidt
H. Schmidt
2
Leibniz Institute for Solid State and Materials Research Dresden
, P.O. Box 27 00 16, D-01171 Dresden, Germany
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a)
Electronic mail: adar@ns.crys.ras.ru.
J. Appl. Phys. 106, 034914 (2009)
Article history
Received:
April 26 2009
Accepted:
July 06 2009
Citation
A. N. Darinskii, M. Weihnacht, H. Schmidt; Rayleigh wave reflection from single surface imperfections on isotropic substrates. J. Appl. Phys. 1 August 2009; 106 (3): 034914. https://doi.org/10.1063/1.3191676
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