We present a method to use real time, synchrotron x-ray diffraction measurements to determine the strength of shocked single crystals following compression and release during uniaxial strain loading. Aluminum and copper single crystals shocked along [111] were examined to peak stresses ranging from 2 to 6 GPa. Synchrotron x rays were used to probe the longitudinal lattice strains near the rear free surface (16 and depths for Al and Cu, respectively) of the metal crystals following shock compression and release. The 111 diffraction peaks showed broadening indicating a heterogeneous microstructure in the released state. The diffraction peaks also shifted to lower Bragg angles relative to the ambient Bragg angle; the magnitude of the shift increased with increasing impact stress. The Bragg angle shifts and appropriate averaging procedures were used to determine the macroscopic or continuum strength following compression and release. For both crystals, the strengths upon release increased with increasing impact stress and provide a quantitative measure of the strain hardening that occurs in Al(111) and Cu(111) during the shock and release process. Our results for Al(111) are in reasonable agreement with a previous determination based solely on continuum measurements. Two points are noteworthy about the developments presented here: Synchrotron x rays are needed because they provide the resolution required for analyzing the data in the released state; the method presented here can be extended to the shocked state but will require additional measurements.
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1 August 2009
Research Article|
August 10 2009
Real time synchrotron x-ray diffraction measurements to determine material strength of shocked single crystals following compression and release
Stefan J. Turneaure;
Stefan J. Turneaure
a)
Institute for Shock Physics and Department of Physics,
Washington State University
, Pullman, Washington 99164, USA
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Y. M. Gupta
Y. M. Gupta
Institute for Shock Physics and Department of Physics,
Washington State University
, Pullman, Washington 99164, USA
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a)
Electronic mail: stefant@wsu.edu.
J. Appl. Phys. 106, 033513 (2009)
Article history
Received:
June 01 2009
Accepted:
June 29 2009
Citation
Stefan J. Turneaure, Y. M. Gupta; Real time synchrotron x-ray diffraction measurements to determine material strength of shocked single crystals following compression and release. J. Appl. Phys. 1 August 2009; 106 (3): 033513. https://doi.org/10.1063/1.3187929
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