Photoluminescence (PL) spectra of bound excitons were measured in uniaxially strained GaP by performing shock-wave experiments at liquid nitrogen temperatures. GaP samples doped with sulfur or nitrogen were compressed up to 3 GPa when subjected to uniaxial strains along the  crystallographic orientation. PL lines from shallow sulfur donors redshifted upon compression, tracking the reduction in the indirect band gap. PL lines related to the isoelectronic pairs, in contrast, exhibited splitting and nonlinear blueshift. An empirical approach was used to model the behavior. It was shown that the splitting pattern is consistent with the previously proposed symmetry of defects and nonlinearities resulting from the reduction in the exciton binding energy. At high stresses, the lines disappeared due to the ionization of bound excitons.
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Research Article| July 22 2009
Bound exciton luminescence in shock compressed GaP:S and GaP:N
M. D. McCluskey;
Y. M. Gupta;
P. Grivickas, M. D. McCluskey, Y. M. Gupta, Y. Zhang, J. F. Geisz; Bound exciton luminescence in shock compressed GaP:S and GaP:N. J. Appl. Phys. 15 July 2009; 106 (2): 023710. https://doi.org/10.1063/1.3159641
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