The interfacial, electrical, and magnetic properties of the Heusler alloy grown epitaxially on GaAs(100) are presented with an emphasis on the use of this metal-semiconductor combination for a device that operates on the principles of spin-injection between the two materials. Through systematic growth optimization the stoichiometry in the bulk can be controlled to better than ±2%, although the interface is disordered and limits the spin-injection efficiency in a practical spintronic device irrespective of the half-metallic nature of the bulk metal. Molecular beam epitaxial growth was monitored in situ by reflection high energy electron diffraction and the bulk composition was measured ex situ with inductively coupled plasma optical emission spectroscopy. The cubic structure is strained below a thickness of 20 nm on GaAs(100) but relaxed in films thicker than 20 nm. Electrical measurements on the reveal general characteristics of a disordered electron system with insulating behavior for layer thicknesses . Thicker layers show a negative magnetoresistance with extraordinary Hall effect constants up to . Spin polarization transfer across the interface between and GaAs is approximately 6.4% at 5 K in the current of a GaAs diode even with compositional disorder at the interface.
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15 June 2009
Research Article|
June 16 2009
Interfacial, electrical, and spin-injection properties of epitaxial grown on GaAs(100) Available to Purchase
C. D. Damsgaard;
C. D. Damsgaard
a)
1Department of Physics,
Technical University of Denmark
, DK-2800, Lyngby, Denmark
2Cambridge Research Laboratory,
Toshiba Research Europe Limited
, 208 Cambridge Science Park, Milton Road, Cambridge, CB4 0GZ, United Kingdom
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M. C. Hickey;
M. C. Hickey
b)
3Department of Physics, Cavendish Laboratory,
University of Cambridge
, J. J. Thomson Avenue, Cambridge, CB3 0HE, United Kingdom
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S. N. Holmes;
S. N. Holmes
c)
2Cambridge Research Laboratory,
Toshiba Research Europe Limited
, 208 Cambridge Science Park, Milton Road, Cambridge, CB4 0GZ, United Kingdom
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R. Feidenhans'l;
R. Feidenhans'l
4Niels Bohr Institute, Nano-Science Center,
University of Copenhagen
, 2100 Copenhagen Ø, Denmark
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S. O. Mariager;
S. O. Mariager
4Niels Bohr Institute, Nano-Science Center,
University of Copenhagen
, 2100 Copenhagen Ø, Denmark
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C. S. Jacobsen;
C. S. Jacobsen
1Department of Physics,
Technical University of Denmark
, DK-2800, Lyngby, Denmark
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J. B. Hansen
J. B. Hansen
1Department of Physics,
Technical University of Denmark
, DK-2800, Lyngby, Denmark
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C. D. Damsgaard
1,2,a)
M. C. Hickey
3,b)
S. N. Holmes
2,c)
R. Feidenhans'l
4
S. O. Mariager
4
C. S. Jacobsen
1
J. B. Hansen
1
1Department of Physics,
Technical University of Denmark
, DK-2800, Lyngby, Denmark
2Cambridge Research Laboratory,
Toshiba Research Europe Limited
, 208 Cambridge Science Park, Milton Road, Cambridge, CB4 0GZ, United Kingdom
3Department of Physics, Cavendish Laboratory,
University of Cambridge
, J. J. Thomson Avenue, Cambridge, CB3 0HE, United Kingdom
4Niels Bohr Institute, Nano-Science Center,
University of Copenhagen
, 2100 Copenhagen Ø, Denmark
a)
Present address: Department of Micro- and Nanotechnology, Technical University of Denmark, DTU Nanotech, Lyngby, Denmark.
b)
Present address: Francis Bitter Laboratory, MIT, Cambridge MA02139, USA.
c)
Author to whom correspondence should be addressed. Electronic mail: [email protected].
J. Appl. Phys. 105, 124502 (2009)
Article history
Received:
December 30 2008
Accepted:
May 10 2009
Citation
C. D. Damsgaard, M. C. Hickey, S. N. Holmes, R. Feidenhans'l, S. O. Mariager, C. S. Jacobsen, J. B. Hansen; Interfacial, electrical, and spin-injection properties of epitaxial grown on GaAs(100). J. Appl. Phys. 15 June 2009; 105 (12): 124502. https://doi.org/10.1063/1.3148298
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