We report on near normal infrared reflectivity spectra of thick films made of cosputtered transition metal nanograins and in a wide range of metal fractions. ,with conductivity well above the percolation threshold has a frequency and temperature behavior according to what it is find in conducting metal oxides. The electron scattering rate displays a unique relaxation time characteristic of single type of carriers experiencing strong electron-phonon interactions. Using small polaron fits we identify those phonons as glass vibrational modes. , with a metal fraction closer to the percolation threshold, undergoes a metal-nonmetal transition at . Here, as it is suggested by the scattering rate nearly quadratic dependence, we broadly identify two relaxation times (two carrier contributions) associated to a Drude mode and a midinfrared overdamped band, respectively. Disorder induced, the midinfrared contribution drives the phase transition by thermal electron localization. has the reflectivity of an insulator with a distinctive band at originating in electron promotion, localization, and defect induced polaron formation. Angle dependent oblique reflectivity of globally insulating , , and , reveals a remarkable resonance at that band threshold. We understand this as due to the excitation by normal to the film electric fields of defect localized electrons in the metallic nanoparticles. At higher oblique angles, this localized nanoplasma couples to longitudinal optical Berreman phonons resulting in band peak softening reminiscent to the phonon behavior undergoing strong electron-phonon interactions. Singular to a globally insulating phase, we believe that this resonance might be a useful tool for tracking metal-insulator phase transitions in inhomogeneous materials.
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1 June 2009
Research Article|
June 04 2009
Electron dynamics in films made of transition metal nanograins embedded in : Infrared reflectivity and nanoplasma infrared resonance
Néstor E. Massa;
Néstor E. Massa
a)
1Laboratorio Nacional de Investigación y Servicios en Espectroscopía Optica-CEQUINOR,
Universidad Nacional de La Plata
, C.C. 962, 1900 La Plata, Argentina
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Juliano C. Denardin;
Juliano C. Denardin
2Departamento de Física,
Universidad de Santiago de Chile
, Av. Ecuador 3493, Santiago, Chile
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Leandro M. Socolovsky;
Leandro M. Socolovsky
3Instituto de Tecnologías y Ciencias de la Ingeniería,
Universidad de Buenos Aires
, Av. Paseo Colón 850, Buenos Aires, Argentina
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Marcelo Knobel;
Marcelo Knobel
4Instituto de Física, “Gleb Wataghin,”
Universidade Estadual de Campinas
, 13083-970 Campinas, Sao Paulo, Brazil
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X. X. Zhang (Xixiang Zhang)
X. X. Zhang (Xixiang Zhang)
5
Research and Development
, King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia
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a)
Electronic mail: neemmassa@gmail.com.
J. Appl. Phys. 105, 114306 (2009)
Article history
Received:
January 16 2009
Accepted:
March 31 2009
Citation
Néstor E. Massa, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, X. X. Zhang (Xixiang Zhang); Electron dynamics in films made of transition metal nanograins embedded in : Infrared reflectivity and nanoplasma infrared resonance. J. Appl. Phys. 1 June 2009; 105 (11): 114306. https://doi.org/10.1063/1.3126485
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