The presence and nature of fractures can have a profound impact on the elastic and mechanical properties of materials. Whether it is a fracture-induced loss of strength or the creation of a long-wavelength anisotropy, being able to infer the presence and properties of fractures in a material has many applications. Detecting changes in the spectra of mechanical resonances due to the presence of fractures is not difficult. A more interesting issue is which elastic moduli are sensitive to the presence of these fractures and how are these moduli related to the stiffness of the material? Resonant ultrasound spectroscopy was performed on acrylic cylinders with internal cracks. Inversions were performed for both isotropic and anisotropic moduli. Good agreement was obtained between isotropic moduli and projected (optimal isotropic moduli obtained from anisotropic moduli) for nonverlapping cracks. The same projections yielded poorer agreement for the sample with overlapping cracks. The results also show that the degree of anisotropy depends upon the amount of crack overlap, and that the isotropic shear modulus is a reliable measure of decreasing stiffness.
Skip Nav Destination
Article navigation
15 July 2008
Research Article|
July 30 2008
Monitoring crack-induced changes in elasticity with resonant spectroscopy
Brian J. Zadler;
Brian J. Zadler
a)
Department of Physics,
Colorado School of Mines
, Golden, Colorado 80401, USA
Search for other works by this author on:
John A. Scales
John A. Scales
Department of Physics,
Colorado School of Mines
, Golden, Colorado 80401, USA
Search for other works by this author on:
a)
Electronic mail: bzadler@mesoscopic.mines.edu.
J. Appl. Phys. 104, 023536 (2008)
Article history
Received:
July 23 2007
Accepted:
May 11 2008
Citation
Brian J. Zadler, John A. Scales; Monitoring crack-induced changes in elasticity with resonant spectroscopy. J. Appl. Phys. 15 July 2008; 104 (2): 023536. https://doi.org/10.1063/1.2956688
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
A step-by-step guide to perform x-ray photoelectron spectroscopy
Grzegorz Greczynski, Lars Hultman
Selecting alternative metals for advanced interconnects
Jean-Philippe Soulié, Kiroubanand Sankaran, et al.
Defects in semiconductors
Cyrus E. Dreyer, Anderson Janotti, et al.