In this second part of the work, the MAGPAR micromagnetic/finite element model was reused to investigate the physics of the write and erase processes in perpendicular recording. The damping constant needed in the Landav–Lifshitz–Gilbert equation was found by applying the Klaassen nonlinear eddy current damped model and set to be 0.1. Previous work highlighted the fact that domains were formed in the soft magnetic underlayer (SUL) under the writer pole in regions where the field opposes the SUL magnetization direction. The domains participate in flux closure and help a more linear response out of the return pole that enhanced fields with an overshoot and opposite polarity relative to the main pole field. These return pole fields could cause adjacent track erasure and MAGPAR was used to study the physics behind it. Particular attention was given to the analysis of frequency or time dependent effects caused by flux delays from the slow moving SUL domains (between the main and return poles). In contrast, fast writing near the main pole was the result of nonlinear flux driven by efficient writers and large currents with overshoot. The writer and SUL used in this work caused a delay. The delay was analyzed over a range of frequencies between 50 and (i.e., linear densities). The numerical and experimental results showed that this delay played an important role in the erasure process. The strength and location of the return pole erasure fields were affected by the current frequency (i.e., the delay). In particular, the erasure level was substantially reduced at the middle frequencies due to the time match between the current pulses and the domain propagation that influenced flux closure. Return pole field strength increased again at higher frequencies.
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1 April 2008
Proceedings of the 52nd Annual Conference on Magnetism and Magnetic Materials
5-9 November 2007
Tampa, Florida (USA)
Research Article|
Magnetism and Magnetic Materials|
January 28 2008
Writer flux closure, transition degradation mechanism, and frequency dependent side track erasure in perpendicular recording Available to Purchase
Juan Fernandez-de-Castro;
Juan Fernandez-de-Castro
a)
Seagate Technology
, Bloomington, Minnesota 55435, USA
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Jianhua Xue;
Jianhua Xue
Seagate Technology
, Bloomington, Minnesota 55435, USA
Search for other works by this author on:
Pu-Ling Lu;
Pu-Ling Lu
Seagate Technology
, Bloomington, Minnesota 55435, USA
Search for other works by this author on:
Yuming Zhou
Yuming Zhou
Seagate Technology
, Bloomington, Minnesota 55435, USA
Search for other works by this author on:
Juan Fernandez-de-Castro
a)
Jianhua Xue
Pu-Ling Lu
Yuming Zhou
Seagate Technology
, Bloomington, Minnesota 55435, USA
a)
Electronic mail: [email protected].
J. Appl. Phys. 103, 07F511 (2008)
Article history
Received:
September 11 2007
Accepted:
November 01 2007
Citation
Juan Fernandez-de-Castro, Jianhua Xue, Pu-Ling Lu, Yuming Zhou; Writer flux closure, transition degradation mechanism, and frequency dependent side track erasure in perpendicular recording. J. Appl. Phys. 1 April 2008; 103 (7): 07F511. https://doi.org/10.1063/1.2835443
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