We report the first measurement of the optical constants of evaporated gold films by using the surface plasmon resonance curve fitting method with an attenuated total reflection device from 16 to 70 nm thickness at telecommunication wavelengths. The results that were obtained by surface plasmon resonance measurement are in good agreement with those obtained by ellipsometry. Until now, optical constants of thin metal films are known to change according to the thickness due to the variation of the electrical resistivity. This phenomenon is also verified in this study by a simple surface plasmon resonance measurement. It is observed that for the gold films of thicknesses of less than 20 nm, the real part of the refractive index increases and the imaginary part decreases with decreasing film thickness.

1.
E.
Kretschmann
,
Z. Phys.
241
,
313
(
1971
).
2.
W. P.
Chen
and
J. M.
Chen
,
J. Opt. Soc. Am.
71
,
189
(
1981
).
3.
R. A.
Innes
and
J. R.
Sambles
,
J. Phys. F: Met. Phys.
17
,
277
(
1987
).
4.
T.
Inagaki
,
J. P.
Goudonnet
,
P.
Royer
, and
E. T.
Arakawa
,
Appl. Opt.
25
,
3635
(
1986
).
5.
M.
Yano
,
M.
Fukui
,
M.
Haraguchi
, and
Y.
Shintani
,
Surf. Sci.
227
,
129
(
1990
).
6.
T. W.
Ebbesen
,
H. J.
Lezec
,
J. F.
Ghaemi
,
T.
Thio
, and
P. A.
Wolff
,
Nature (London)
391
,
667
(
1998
).
7.
W. L.
Barnes
,
A.
Dereux
, and
T. W.
Ebbesen
,
Nature (London)
424
,
824
(
2003
).
8.
J.
Homola
,
S. S.
Yee
, and
G.
Gauglitz
,
Sens. Actuators B
54
,
3
(
1999
).
9.
P. B.
Johnson
and
R. W.
Christy
,
Phys. Rev. B
6
,
4370
(
1972
).
10.
11.
T.
Nikolajsen
,
K.
Leosson
,
I.
Salakhutdinov
, and
S. I.
Bozhevolnyi
,
Appl. Phys. Lett.
82
,
668
(
2003
).
12.
J. J.
Burke
,
G. I.
Stegeman
, and
T.
Tamir
,
Phys. Rev. B
33
,
5186
(
1986
).
13.
14.
15.
P.
Berini
,
R.
Charbonneau
,
N.
Lahoud
, and
G.
Mattiussi
,
J. Appl. Phys.
98
,
043109
(
2005
).
16.
M. -L.
Thèye
,
Phys. Rev. B
2
,
3060
(
1970
).
17.
P.
Gadenne
and
G.
Vuye
,
J. Phys. E
10
,
733
(
1977
).
18.
C.
Reale
,
Infrared Phys.
10
,
173
(
1970
).
19.
H.
Reather
,
Surface Plasmons on Smooth and Rough Surfaces and on Gratings
(
Springer
,
Berlin
,
1988
).
20.
P. R.
Bevington
and
D. K.
Robinson
,
Data Reduction and Error Analysis for the Physical Sciences
(
McGraw-Hill
,
New York
,
1992
).
21.
W. L.
Wolfe
,
American Institute of Physics Handbook
(
McGraw-Hill
,
New York
,
1963
).
22.
Handbook of Optical Constants of Solids
, edited by
E. D.
Palik
(
Academic
,
Orlando, Florida
,
1985
).
23.
M.
Ohring
,
The Materials Science of Thin Films
(
Academic
,
London
,
1992
).
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