The local and average texture of thick polycrystalline CdTe films is determined before, upon, and after the coalescence of the initially isolated islands, using electron backscattered diffraction and x-ray powder diffraction. The coalescence and postcoalescence processes lead to a preferential texturation, initially along the ⟨531⟩ and ⟨100⟩ crystallographic directions and then along the ⟨110⟩ preferred orientation. The selection of grain orientation during the film growth is found to be driven by strain energy minimization. A model for the microyield stress is developed when plasticity is confined to each elemental grain and accounts for the ⟨531⟩ and ⟨100⟩ preferred orientations. On the contrary, when plastic deformation can propagate from one grain to its neighbors, the Hall–Petch model applies and leads to the ⟨110⟩ preferred orientation. Furthermore, at the end of growth, the stronger ⟨111⟩ preferred orientation is observed and arises because of kinetic limitations.

1.
S. M.
Sze
,
Semiconductor Devices Physics and Technology
(
Wiley
,
New York
,
1985
).
2.
S. M.
Sze
,
Semiconductor Sensors
(
Wiley
,
New York
,
1994
).
3.
J. E.
Sanchez
and
E.
Arzt
,
Scr. Metall. Mater.
27
,
285
(
1992
).
4.
C. V.
Thompson
,
Scr. Metall. Mater.
28
,
167
(
1993
).
5.
P.
Sonnweber-Ribic
,
P.
Gruber
,
G.
Dehm
, and
E.
Arzt
,
Acta Mater.
54
,
3863
(
2006
).
6.
K.
Mirpuri
,
H.
Wendrock
,
S.
Menzel
,
K.
Wetzig
, and
J.
Szpunar
,
Thin Solid Films
496
,
703
(
2006
).
7.
H. R.
Moutinho
,
M. M.
Al-Jassim
,
D. H.
Levi
,
P. C.
Dippo
, and
L. L.
Kazmerski
,
J. Vac. Sci. Technol. A
16
,
1251
(
1998
).
8.
G.
Zoppi
,
K.
Durose
,
S. J. C.
Irvine
, and
V.
Barrioz
,
Semicond. Sci. Technol.
21
,
763
(
2006
).
9.
A.
Romeo
,
D. L.
Bätzner
,
H.
Zogg
, and
A. N.
Tiwari
,
Thin Solid Films
361–362
,
420
(
2000
).
10.
C. V.
Thompson
and
R.
Carel
,
J. Mech. Phys. Solids
44
,
657
(
1996
).
11.
C. V.
Thompson
,
J. Appl. Phys.
58
,
763
(
1985
).
12.
C. V.
Thompson
,
Annu. Rev. Mater. Sci.
30
,
159
(
2000
).
13.
W. D.
Nix
and
B. M.
Clemens
,
J. Mater. Res.
14
,
3467
(
1999
).
14.
L. B.
Freund
and
E.
Chason
,
J. Appl. Phys.
89
,
4866
(
2001
).
15.
C. V.
Thompson
and
R.
Carel
,
Mater. Sci. Eng.
B32
,
211
(
1995
).
16.
V.
Consonni
,
G.
Feuillet
, and
S.
Renet
,
J. Appl. Phys.
99
,
053502
(
2006
).
17.
H. R.
Moutinho
,
F. S.
Hasoon
,
F.
Abulfotuh
, and
L. L.
Kazmerski
,
J. Vac. Sci. Technol. A
13
,
2877
(
1995
).
18.
U.
Welzel
,
J.
Ligot
,
P.
Lamparter
,
A. C.
Vermeulen
, and
E. J.
Mittemeijer
,
J. Appl. Crystallogr.
38
,
1
(
2005
).
19.
I. C.
Noyan
and
J. B.
Cohen
,
Residual Stress: Measurement by Diffraction and Interpretation
(
Springer-Verlag
,
New York
,
1987
).
20.
E. Y.
Gutmanas
,
N.
Travitzky
,
U.
Plitt
, and
P.
Haasen
,
Scr. Metall.
13
,
293
(
1979
).
21.
C. V.
Thompson
,
J. Mater. Res.
8
,
237
(
1993
).
23.
H. J.
McSkimin
and
D. G.
Thomas
,
J. Appl. Phys.
33
,
56
(
1962
).
24.
J. P.
Hirth
and
J.
Lothe
,
Theory of Dislocations
(
Wiley
,
New York
,
1982
).
25.
D. J.
Williams
,
Properties of Narrow Gap Cadmium-based Compounds
(
INSPEC
,
London
,
1994
).
26.
H. F.
Mataré
,
J. Appl. Phys.
56
,
2605
(
1984
).
27.
S.
Smith
,
P.
Zhang
,
T.
Gessert
, and
A.
Mascarenhas
,
Appl. Phys. Lett.
85
,
3854
(
2004
).
28.
R. C.
Cammarata
,
T. M.
Trimble
, and
D. J.
Srolovitz
,
J. Mater. Res.
15
,
2468
(
2000
).
29.
S. C.
Seel
,
C. V.
Thompson
,
S. J.
Hearne
, and
J. A.
Floro
,
J. Appl. Phys.
88
,
7079
(
2000
).
30.
J. A.
Floro
,
S. J.
Hearne
,
J. A.
Hunter
,
P.
Kotula
,
E.
Chason
,
S. C.
Seel
, and
C. V.
Thompson
,
J. Appl. Phys.
89
,
4886
(
2001
).
31.
R.
Koch
,
H.
Dongzhi
, and
A. K.
Das
,
Phys. Rev. Lett.
94
,
146101
(
2005
).
32.
C.
Friesen
and
C. V.
Thompson
,
Phys. Rev. Lett.
89
,
126103
(
2002
).
33.
E.
Chason
,
B. W.
Sheldon
,
L. B.
Freund
,
J. A.
Floro
, and
S. J.
Hearne
,
Phys. Rev. Lett.
88
,
156103
(
2002
).
34.
V.
Consonni
,
G.
Feuillet
,
J.
Bleuse
, and
F.
Donatini
,
J. Appl. Phys.
101
,
063522
(
2007
).
35.
J. M.
Zhang
,
K. W.
Xu
, and
V.
Ji
,
Appl. Surf. Sci.
185
,
177
(
2002
).
36.
J.
Godet
,
L.
Pizzagalli
,
S.
Brochard
, and
P.
Beauchamp
,
Phys. Rev. B
70
,
054109
(
2004
).
37.
W. D.
Nix
,
Metall. Trans. A
20
,
2217
(
1989
).
38.
F.
Huang
and
M. L.
Weaver
,
J. Appl. Phys.
98
,
073505
(
2005
).
39.
F.
Louchet
,
J.
Weiss
, and
T.
Richeton
,
Phys. Rev. Lett.
97
,
075504
(
2006
).
40.
E. O.
Hall
,
Proc. Phys. Soc. London, Sect. B
64
,
747
(
1957
).
41.
N. J.
Petch
,
J. Iron Steel Inst., London
17
,
25
(
1953
).
42.
J. C. M.
Li
,
Trans. Metall. Soc. AIME
227
,
239
(
1963
).
43.
44.
JCPDS-ICDD Card No. 15-0770, International Center for Diffraction Data, Newton Square, PA.
You do not currently have access to this content.