One knows the imaging system's properties are central to the correct interpretation of any image. In a scanning electron microscope regions of different composition generally interact in a highly nonlinear way during signal generation. Using Monte Carlo simulations we found that in resin-embedded, heavy metal-stained biological specimens staining is sufficiently dilute to allow an approximately linear treatment. We then mapped point-spread functions for backscattered-electron contrast, for primary energies of 3 and 7 keV and for different detector specifications. The point-spread functions are surprisingly well confined (both laterally and in depth) compared even to the distribution of only those scattered electrons that leave the sample again.
Skip Nav Destination
Article navigation
15 December 2007
Research Article|
December 17 2007
Point-spread functions for backscattered imaging in the scanning electron microscope
Philipp Hennig;
Philipp Hennig
a)
Max-Planck-Institute for Medical Research
, Jahnstrasse 29, 69120 Heidelberg, Germany
Search for other works by this author on:
Winfried Denk
Winfried Denk
b)
Max-Planck-Institute for Medical Research
, Jahnstrasse 29, 69120 Heidelberg, Germany
Search for other works by this author on:
a)
Present address: Robinson College, CB3 9AN Cambridge, United Kingdom. Electronic mail: ph347@cam.ac.uk.
b)
Electronic mail: winfried.denk@mpimf-heidelberg.mpg.de.
J. Appl. Phys. 102, 123101 (2007)
Article history
Received:
May 20 2007
Accepted:
October 11 2007
Citation
Philipp Hennig, Winfried Denk; Point-spread functions for backscattered imaging in the scanning electron microscope. J. Appl. Phys. 15 December 2007; 102 (12): 123101. https://doi.org/10.1063/1.2817591
Download citation file:
Sign in
Don't already have an account? Register
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Sign in via your Institution
Sign in via your InstitutionPay-Per-View Access
$40.00
Citing articles via
Related Content
Miniature random-access fiber scanner for in vivo multiphoton imaging
J. Appl. Phys. (August 2007)
A simple device for preparing small area junctions for inelastic electron tunneling spectroscopy and for other four point junctions
Rev Sci Instrum (February 1991)
Spread rates of spread models with frozen symbols
Chaos (October 2022)
Spread F phenomenon
AIP Conference Proceedings (January 1992)